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Theses

Modélisation de l’injection de faute électromagnétique sur circuits intégrés sécurisés et contre-mesures

Mathieu Dumont 1
1 SmartIES - Smart Integrated Electronic Systems
LIRMM - Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier
Abstract : This thesis is devoted to the study of electromagnetic fault injection attack on se-cure integrated circuits. Electrical modeling permits to simulate the coupling between an EM probe injection and the circuit supply and ground grids in order to understand the effect of the EM pulse. This modeling is then applied on a logic circuit simulation with a D flip-flop and its components. The simulation results were used to determine the various faults that could be induced by this attack and to explain their formation. Measurements on a test circuit revealed the appearance of timing and sampling faults and validated ex-perimentally the proposed model. Finally, some countermeasures based on the model are proposed in order to increase the robustness of a circuit against electromagnetic fault in-jection.
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Theses
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Mathieu Dumont. Modélisation de l’injection de faute électromagnétique sur circuits intégrés sécurisés et contre-mesures. Autre. Université Montpellier, 2020. Français. ⟨NNT : 2020MONTS031⟩. ⟨tel-03160444⟩

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