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Méthodes et outils pour l'évaluation de la sensibilité de circuits intégrés avancés face aux radiations naturelles

Abstract : The reduction of electrical parameters of transistors, resulting of the progress done in the IC's manufacturing technologies, make present and future devices more and more sensitive to transient perturbations, so-called S.E.E. (Single Event Effects) provoked as the consequence of the current pulse issued from the impact with sensitive areas of the circuit, of energetic particles present in the environment where the circuit operates [1]. Among the different types of S.E.E. can be mentioned the SEU (Single Event Upsets) which consist in the inversion of the content of memory cells, the SEL (Single Event Latchup) which may lead to the device destruction as the consequence of thermal effects. This thesis aims at giving a description and validating the methodologies required to estimate the sensitivity to radiations of two types of digital integrated circuits, processors and memories, components used in embedded systems.
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https://tel.archives-ouvertes.fr/tel-00441658
Contributor : Paul Peronnard <>
Submitted on : Thursday, December 17, 2009 - 11:02:18 AM
Last modification on : Friday, December 11, 2020 - 8:28:04 AM
Long-term archiving on: : Thursday, September 23, 2010 - 6:14:43 PM

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  • HAL Id : tel-00441658, version 3

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CNRS | TIMA | UGA

Citation

Paul Peronnard. Méthodes et outils pour l'évaluation de la sensibilité de circuits intégrés avancés face aux radiations naturelles. Micro et nanotechnologies/Microélectronique. Université Joseph-Fourier - Grenoble I, 2009. Français. ⟨tel-00441658v3⟩

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