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Infrared Imaging for Integrated Circuit Trust and Hardware Security

Abstract : The generalization of integrated circuits and more generally electronics to everyday life systems (military, finance, health, etc) rises the question about their security. Today, the integrity of such circuits relies on a large panel of known attacks for which countermeasures have been developed. Hence, the search of new vulnerabilities represents one of the largest contribution to hardware security. The always rising complexity of dies leads to larger silicon surfaces.Circuit imaging is therefore a popular step among the hardware security community in order to identify regions of interest within the die. In this objective, the work presented here proposes new methodologies for infrared circuit imaging. In particular, it is demonstrated that statistical measurement analysis can be performed for automated localization of active areas in an integrated circuit.Also, a new methodology allowing efficient statistical infrared image comparison is proposed. Finally, all results are acquired using a cost efficient infrared measurement platform that allows the investigation of weak electrical source, detecting power consumption as low as 200 µW.
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  • HAL Id : tel-02478875, version 1

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Maxime Cozzi. Infrared Imaging for Integrated Circuit Trust and Hardware Security. Micro and nanotechnologies/Microelectronics. Université Montpellier, 2019. English. ⟨NNT : 2019MONTS046⟩. ⟨tel-02478875⟩

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