S. Larguech, Efficiency evaluation of analog/RF alternate test: comparative study of indirect measurement selection strategies, pp.1091-1102, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01232890

S. Larguech, A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy, pp.621-626, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01233104

S. Larguech, Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing, Proc. Latin-American Test Workshop (LATW), pp.1-6, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01119361

S. Larguech, A Generic Methodology for Building Efficient Prediction Models in the Context of Alternate Testing, pp.1-6, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01233150

H. Ayari, F. Azais, S. Bernard, V. Kerzerho, M. Comte et al., Investigations on alternate analog/RF test with model redundancy, Statistical Test Methods Workshop (STEM), 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01119374

S. Darfeuille and C. Kelma, Production test of an rf receiver chain based on atm combining rf bist and machine learning algorithm, Circuit Theory and Design (ECCTD), 2011 20th European Conference on, pp.653-656, 2011.

M. Dresler, Technique to detect rf interface and contact issues during production testing, IEEE International Test Conference, 2006.

S. Erdem, S. Erdogan, and . Ozev, A multi-site test solution for quadrature modulation rf transceivers. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol.30, issue.9, pp.1421-1425, 2011.

A. Chatterjee and N. Nagi, Design for testability and built-in self-test of mixed-signal circuits: A tutorial, VLSI Design, 1997. Proceedings., Tenth International Conference on, pp.388-392, 1997.

A. Rumiantsev and R. Doerner, Rf probe technology: History and selected topics. Microwave Magazine, IEEE, vol.14, issue.7, pp.46-58, 2013.

N. Pramodchandran, A. Variyam, and . Chatterjee, Enhancing test effectiveness for analog circuits using synthesized measurements, VLSI Test Symposium, pp.132-137, 1998.

N. Pramodchandran, S. Variyam, A. Cherubal, and . Chatterjee, Prediction of analog performance parameters using fast transient testing. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol.21, issue.3, pp.349-361, 2002.

B. Jay, S. W. Brockman, and . Director, Predictive subset testing: Optimizing ic parametric performance testing for quality, cost, and yield. Semiconductor Manufacturing, IEEE Transactions on, vol.2, issue.3, pp.104-113, 1989.

-. Haralampos, P. Stratigopoulos, M. Drineas, Y. Slamani, and . Makris, Rf specification test compaction using learning machines. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on, vol.18, issue.6, pp.998-1002, 2010.

R. Voorakaranam, R. Newby, S. Cherubal, B. Cometta, T. Kuehl et al., Production deployment of a fast transient testing methodology for analog circuits: Case study and results, p.1174, 2003.

S. Sermet-akbay, A. Halder, A. Chatterjee, and D. Keezer, Low-cost test of embedded rf/analog/mixed-signal circuits in sops. Advanced Packaging, IEEE Transactions on, vol.27, issue.2, pp.352-363, 2004.

S. Cherubal, R. Voorakaranam, A. Chatterjee, J. Mclaughlin, J. L. Smith et al., Concurrent rf test using optimized modulated rf stimuli, Proceedings. 17th International Conference on, pp.1017-1022, 2004.

A. Halder and A. Chatterjee, Low-cost alternate evm test for wireless receiver systems, VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, pp.255-260, 2005.

S. Ellouz, P. Gamand, C. Kelma, B. Vandewiele, and B. Allard, Combining internal probing with artificial neural networks for optimal rfic testing, Test Conference, 2006. ITC'06, pp.1-9, 2006.
URL : https://hal.archives-ouvertes.fr/hal-00369455

S. Goyal, A. Chatterjee, and M. Purtell, A low-cost test methodology for dynamic specification testing of high-speed data converters, Journal of Electronic Testing, vol.23, issue.1, pp.95-106, 2007.

A. Chatterjee, A. Banerjee, and S. Kook, Dynamic specification testing and diagnosis of high precision sigma-delta adcs, IEEE Design & Test of Computers, issue.1, p.1, 2012.

X. Sen-wen-hsiao, A. Wang, and . Chatterjee, Analog sensor based testing of phase-locked loop dynamic performance parameters, Test Symposium (ATS), 2013 22nd Asian, pp.50-55, 2013.

H. Ian, E. Witten, and . Frank, Data Mining: Practical machine learning tools and techniques, 2005.

U. Fayyad, G. Piatetsky-shapiro, and P. Smyth, From data mining to knowledge discovery in databases. AI magazine, vol.17, p.37, 1996.

C. Gera and K. Joshi, A survey on data mining techniques in the medicative field, International Journal of Computer Applications, vol.113, issue.13, 2015.

E. Gately, Neural networks for financial forecasting, 1995.

P. Dixit, . Ghanshyam, and . Prajapati, Machine learning in bioinformatics: A novel approach for dna sequencing, Advanced Computing & Communication Technologies (ACCT), pp.41-47, 2015.

H. J. Kim, S. Michael-i-jordan, A. Sastry, and . Ng, Autonomous helicopter flight via reinforcement learning, Advances in neural information processing systems, p.page None, 2003.

L. Zq-john, The elements of statistical learning: data mining, inference, and prediction, Journal of the Royal Statistical Society: Series A (Statistics in Society), vol.173, issue.3, pp.693-694, 2010.

Y. Anzai, Pattern Recognition & Machine Learning, 2012.

J. and R. Quinlan, Induction of decision trees, Machine learning, vol.1, issue.1, pp.81-106, 1986.

. Jerome-h-friedman, Multivariate adaptive regression splines. The annals of statistics, pp.1-67, 1991.

L. Peter and . Flom, Alternative methods of regression when ols is not right, 2015.

C. Cortes and V. Vapnik, Support-vector networks, Machine learning, vol.20, issue.3, pp.273-297, 1995.

E. Youn and M. K. Jeong, Class dependent feature scaling method using naive bayes classifier for text datamining, Pattern Recognition Letters, vol.30, issue.5, pp.477-485, 2009.

-. Haralampos, Y. Stratigopoulos, and . Makris, Error moderation in low-cost machine-learning-based analog/rf testing. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on, vol.27, issue.2, pp.339-351, 2008.

-. Haralampos, S. Stratigopoulos, E. Mir, S. Acar, and . Ozev, Defect filter for alternate rf test, Test Symposium, 2009 14th IEEE European, pp.101-106, 2009.

-. Haralampos, P. Stratigopoulos, M. Drineas, Y. Slamani, and . Makris, Non-rf to rf test correlation using learning machines: A case study, VLSI Test Symposium, 2007. 25th IEEE, pp.9-14, 2007.

G. D. Haralampos, Y. Stratigopoulos, and . Makris, Nonlinear decision boundaries for testing analog circuits, IEEE Transactions on, vol.24, issue.11, pp.1760-1773, 2005.

P. Viera-stopjaková, M. Malo?ek, V. Matej, M. Nagy, and . Margala, Defect detection in analog and mixed circuits by neural networks using wavelet analysis. Reliability, IEEE Transactions on, vol.54, issue.3, pp.441-448, 2005.

R. Voorakaranam, S. Sermet-akbay, S. Bhattacharya, S. Cherubal, and A. Chatterjee, Signature testing of analog and rf circuits: Algorithms and methodology. Circuits and Systems I: Regular Papers, IEEE Transactions on, vol.54, issue.5, pp.1018-1031, 2007.

J. M. Ronald-l-iman, D. K. Davenport, and . Zeigler, Latin hypercube sampling (program user's guide), 1980.

H. Ayari, F. Azais, S. Bernard, M. Comte, V. Kerzerho et al., On the use of redundancy to reduce prediction error in alternate analog/rf test, Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), pp.34-39, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00803556

H. Ayari, F. Azaïs, S. Bernard, M. Comte, V. Kerzerho et al., Enhancing confidence in indirect analog/rf testing against the lack of correlation between regular parameters and indirect measurements, Microelectronics Journal, vol.45, issue.3, pp.336-344, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-00936443

S. Larguech, F. Azais, S. Bernard, V. Kerzerho, M. Comte et al., Evaluation of indirect measurement selection strategies in the context of analog/rf alternate testing, Test Workshop-LATW, 2014 15th Latin American, pp.1-6, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-01119361

J. D. Wichard, C. Ogorzalek, and . Merkwirth, Entool-a toolbox for ensemble modelling, Europhysics conference abstracts ECA, vol.27, pp.105-105, 2003.

H. Ayari, Indirect Analog/RF IC Testing: Confidence & Robusteness improvments, 2013.
URL : https://hal.archives-ouvertes.fr/tel-00998677

M. Douglas and . Hawkins, Identification of outliers, vol.11, 1980.

P. Gordon and . Hughes, On the mean accuracy of statistical pattern recognizers. Information Theory, IEEE Transactions on, vol.14, issue.1, pp.55-63, 1968.

V. Cherkassky and F. M. Mulier, Learning from data: concepts, theory, and methods, 2007.

J. Victoria, J. Hodge, and . Austin, A survey of outlier detection methodologies, Artificial Intelligence Review, vol.22, issue.2, pp.85-126, 2004.

N. Kupp, P. Drineas, M. Slamani, and Y. Makris, Confidence estimation in non-rf to rf correlation-based specification test compaction, Test Symposium, pp.35-40, 2008.

S. Larguech, . Azais, . Bernard, . Comte, and . Kerzerho, A generic methodology for building efficient prediction models in the context of alternate testing, Mixed-Signal Testing Workshop (IMSTW), pp.1-6, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01233150

S. Sermet-akbay and A. Chatterjee, Built-in test of rf components using mapped feature extraction sensors, VLSI Test Symposium, 2005. Proceedings. 23rd IEEE, pp.243-248, 2005.

L. Abdallah, -. Haralampos, C. Stratigopoulos, S. Kelma, and . Mir, Sensors for built-in alternate rf test, Test Symposium (ETS), 2010 15th IEEE European, pp.49-54, 2010.
URL : https://hal.archives-ouvertes.fr/hal-00558886

R. Manuel-j-barragan, G. Fiorelli, A. Leger, J. Rueda, and . Huertas, Improving the accuracy of rf alternate test using multi-vdd conditions: application to envelope-based test of lnas, Test Symposium (ATS), 2011 20th Asian, pp.359-364, 2011.

-. Haralampos and . Stratigopoulos, Fundamentals of machine learning and its applications in test, 2015.

I. Guyon and A. Elisseeff, An introduction to variable and feature selection, The Journal of Machine Learning Research, vol.3, pp.1157-1182, 2003.

J. Manuel, G. Barragan, and . Leger, Efficient selection of signatures for analog/rf alternate test, Test Symposium (ETS), 2013 18th IEEE European, pp.1-6, 2013.

J. Gábor, M. L. Székely, and . Rizzo, Brownian distance covariance. The annals of applied statistics, vol.3, pp.1236-1265, 2009.

H. Ayari, F. Azais, S. Bernard, M. Comte, M. Renovell et al., Smart selection of indirect parameters for dc-based alternate rf ic testing, VLSI Test Symposium (VTS), pp.19-24, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00803453

J. Liaperdos, A. Arapoyanni, and Y. Tsiatouhas, Adjustable rf mixers' alternate test efficiency optimization by the reduction of test observables. ComputerAided Design of Integrated Circuits and Systems, IEEE Transactions on, vol.32, issue.9, pp.1383-1394, 2013.

H. Ayari, F. Azais, S. Bernard, M. Comte, V. Kerzerho et al., Making predictive analog/rf alternate test strategy independent of training set size, Test Conference (ITC), pp.1-9, 2012.
URL : https://hal.archives-ouvertes.fr/lirmm-00803564

I. Jolliffe, Principal component analysis, 2002.

J. Benesty, J. Chen, Y. Huang, and I. Cohen, Pearson correlation coefficient, Noise reduction in speech processing, pp.1-4, 2009.

H. Ayari, F. Azais, S. Bernard, M. Comte, V. Kerzerho et al., New implementions of predictive alternate analog/rf test with augmented model redundancy, Proceedings of the conference on Design, Automation & Test in Europe, p.131, 2014.
URL : https://hal.archives-ouvertes.fr/lirmm-00994714

Z. Zhou, Ensemble methods: foundations and algorithms, 2012.