Single Event Effect testing of NAND Flash memory ,
Flash test results based on heavy-ion testing ,
Flash test results based on proton test results ,
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The MTCube Science Mission, Chapter ,
, orbit Single Error Rate (SER) methodology
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Single Error Rate (SER) estimation ,
155 6.3.2 Other approximations used for the SER estimation ,
3.4 Pessimistic case soft error rate analysis, orbit average rate calculation for the MTCube Science Experiment ,
161 6.4.2 Estimation of the average generated data ,
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Heavy-ion Radiation Impact on a 4Mb FRAM under Different Test Modes and Conditions, IEEE Transactions on Nuclear Science, vol.63, 2016. ,
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Soft Errors in COTS SRAM Memories, In press in Journal of Semiconductor Science and Technology, 2016. ,
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs, IEEE Transactions on Nuclear Science, vol.62, issue.6, pp.2620-2626, 2015. ,
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, SEE on Different Layers of Stacked-SRAMs, vol.62, pp.2673-2678, 2015.
URL : https://hal.archives-ouvertes.fr/lirmm-01254148
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Impact of Stacked-Layer Structure on SEE Rate of SRAMs, « Investigation on MCU Clustering Methodologies for CrossSection Estimation of SRAMs, 2015. ,
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A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing, RADECS, 2015. ,
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Real-Time SRAM Based Particle Detector, 2015. ,
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Experimental Heavy-Ion SEU Cross-Sections Of Sram Memory Components, Physics Days, pp.11-12, 2014. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01238439
Presentation of the MTCube CubeSat Project, Small Satellites Systems and Services (4S) Symposium, pp.26-30, 2014. ,
URL : https://hal.archives-ouvertes.fr/lirmm-01272951