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Enhanced Raman signatures on copper based-materials

Abstract : This thesis studies the enhanced Raman signatures on copper based materials. Thin copper films were prepared and studied before and after thermal oxidation in air, under 200 °C. Their microstructure has been characterized by SEM and AFM. The thickness of the copper and cuprous oxide films have been characterized locally by those techniques, and by ellipsometry and UV-visible absorption spectroscopic techniques. A modeling of the UV-visible spectra has been performed based on interference calculations using Fresnel equations, allowing the determination of both the thicknesses and the refractive indices of the films. Raman study of these samples allows a quantification of the interference enhanced Raman phenomenon (IERS). Other copper nanostructured samples covered with single layer graphene (SLG) have been studied, and The Raman intensity of SLG discussed in terms of IERS. The last part of the manuscript is dedicated to SERS studies of molecules deposited on nanostructured golden commercial substrates and to the evolution of the Raman the signal after covering these substrates with a thin copper layer.
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Submitted on : Tuesday, December 4, 2018 - 2:56:06 PM
Last modification on : Tuesday, September 8, 2020 - 5:25:44 AM


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  • HAL Id : tel-01944233, version 1



Deniz Cakir. Enhanced Raman signatures on copper based-materials. Other [cond-mat.other]. Université Montpellier, 2017. English. ⟨NNT : 2017MONTS066⟩. ⟨tel-01944233⟩



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