Metalorganic Vapor Phase Epitaxial Growth and Properties of GaN/Al0.1Ga0.9N Layered Structures, Jpn. J. Appl. Phys, vol.30, issue.9R, p.1924, 1991. ,
Candela-class high-brightness InGaN/AlGaN double-heterostructure blue-light-emitting diodes, Appl. Phys. Lett, vol.64, issue.13, pp.1687-1689, 1994. ,
InxGa(1?x)N/InyGa(1?y)N superlattices grown on GaN films, J. Appl. Phys, vol.74, issue.6, pp.3911-3915, 1993. ,
Blue LEDs -Filling the world with new light, Nobel Prize Lecture. Stockholm: The Nobel Foundation. Available at, 2015. ,
Recent progress of GaN power devices for automotive applications, Jpn. J. Appl. Phys, vol.53, issue.10, p.100210, 2014. ,
Lateral GaN Transistors -A Replacement for IGBT devices in Automotive Applications, Proceedings of International Exhibition and Conference for Power Electronics, Intelligent Motion, pp.310-317, 2014. ,
GaN Power Device and Reliability for Automotive Applications, IEEE International Reliability Physics Symposium (IRPS), 2012. ,
Being Seventy-Five Still Young: The Doherty Power Amplifier, Microw. J, vol.55, issue.4, pp.72-88, 2012. ,
Design of dual-band gan doherty power amplifier using a simplified structure, Microw. Opt. Technol. Lett, vol.57, issue.4, pp.953-956, 2015. ,
PLUS AESA & METEOR: An even more potent Rafale, Vayau Aerospace and Defence Review, vol.1, p.44, 2013. ,
A new generation of Gallium Nitride (GaN) based Solid State Power Amplifiers for Satellite Communication, pp.1-8, 2012. ,
GaN technologies and developments: Status and trends, IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT), pp.488-491, 2010. ,
Low frequency and linear high frequency noise performances of AlGaN/GaN grown on SiC substrate, IEEE European Gallium Arsenide and Other Compound Semiconductors Application Symposium EGAAS, p.15, 2005. ,
URL : https://hal.archives-ouvertes.fr/hal-00154917
GaN Ku-band low-noise amplier design including RF life test, Int. J. Numer. Model. Electron. Networks, Devices Fields, vol.28, issue.6, pp.717-731, 2015. ,
Design of a X-band GaN oscillator: from the low frequency noise device characterization and large signal modeling to circuit design, IEEE MTT-S International Microwave Symposium (IMS, pp.747-750, 2006. ,
URL : https://hal.archives-ouvertes.fr/hal-00128228
6-12 GHz Double-Balanced Image-Reject Mixer MMIC in 0.25 um AlGaN/GaN Technology, Int. J. Microw. Wirel. Technol, vol.7, issue.3-4, pp.307-315, 2015. ,
Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental tools -Electrical and T-CAD models, IEEE Mediterranean Electrotechnical Conference (MELECON), pp.237-242, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01877587
III-V coumpound semiconductors: integration with silicon-based microelectronics, 2010. ,
Reliability prediction of electronic equipment, 1991. ,
Industrial GaN FET technology, Int. J. Microw. Wirel. Technol, vol.2, issue.1, pp.21-32, 2010. ,
GH25-10: New qualified power GaN HEMT process From Technology to Product overview, IEEE European Microwave Integrated Circuit Conference (EuMIC), pp.225-228, 2014. ,
Analysis of Schottky gate degradation evolution in AlGaN/GaN HEMTs during HTRB stress, Microelectron. Reliab, vol.53, issue.9, pp.1450-1455, 2013. ,
URL : https://hal.archives-ouvertes.fr/hal-01002643
High Temperature Reverse Bias ( HTRB ), pp.1-2 ,
GaN for space application : almost ready for flight, Int. J. Microw. Wirel. Technol, vol.2, issue.1, pp.121-133, 2010. ,
Reliability Status of GaN Transistors and MMICs in Europe, IEEE International Reliability Physics Symposium (IRPS), pp.129-133, 2010. ,
High Temperature , High Power RF Life Testing of GaN on SiC RF Power Transistors, pp.1-7 ,
Reliability behavior of GaN HEMTs related to Au diffusion at the Schottky interface, Phys. status solidi, vol.6, issue.S2, pp.976-979, 2009. ,
Ohmic contacts to Gallium Nitride materials, Appl. Surf. Sci, vol.383, pp.324-345, 2016. ,
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices, Microelectron. Reliab, vol.76, pp.338-343, 2017. ,
Thermal stability of Mo-based Schottky contact for AlGaN/GaN HEMT, Electron. Lett, vol.41, issue.16, pp.927-928, 2005. ,
URL : https://hal.archives-ouvertes.fr/hal-00126456
A 3000 hours DC Life Test on AlGaN/GaN HEMT for RF and microwave applications, Microelectron. Reliab, vol.45, issue.9, pp.1617-1621, 2005. ,
,
Evidence of Traps Creation in GaN/AlGaN/GaN HEMTs After a 3000 Hour On-state and Off-state Hot-electron Stress, Electron Devices Meet, p.4, 2005. ,
Development and analysis of low resistance ohmic contact to nAlGaN/GaN HEMT, Diam. Relat. Mater, vol.16, pp.262-266, 2007. ,
Degradation of Ti/Al/Ni/Au as ohmic contact metal for GaN HEMTs, Microelectron. Reliab, vol.49, issue.9, pp.1222-1225, 2009. ,
Operation of ohmic Ti/Al/Pt/Au multilayer contacts to GaN at 600 C in air, Appl. Phys. Lett, vol.105, issue.8, p.81905, 2014. ,
Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs, Microelectron. Reliab, vol.49, issue.9, pp.1216-1221, 2009. ,
URL : https://hal.archives-ouvertes.fr/hal-00401323
Characterization and analysis of electrical trap related effects on the reliability of AlGaN/GaN HEMTs, Solid State Electron, vol.72, pp.15-21, 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-00788193
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs, Microelectron. Reliab, vol.51, pp.224-228, 2011. ,
I-DLTS , Electrical Lag and Low Frequency Noise Measurements of Trapping Effects in ,
URL : https://hal.archives-ouvertes.fr/hal-01343977
, Microw. Integr. Circuits Conf. (EuMIC), pp.438-441, 2011.
Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies, Microelectron. Reliab, vol.55, issue.9, pp.1714-1718, 2015. ,
URL : https://hal.archives-ouvertes.fr/hal-01234080
Mechanisms for Electrical Degradation of GaN HighElectron Mobility Transistors, Electron Devices Meet, vol.29, pp.1-4, 2006. ,
Gate Current Degradation Mechanisms of GaN High Electron Mobility Transistors, Electron Devices Meet, pp.385-388, 2007. ,
Piezoelectric strain in AlGaN/GaN heterostructure field-effect transistors under bias, Appl. Phys. Lett, vol.88, issue.10, p.103502, 2006. ,
Strain effects in freestanding threedimensional nitride nanostructures, Phys. Status Solidi, vol.2, issue.11, pp.3891-3894, 2005. ,
, situ strain measurements on GaN/AlGaN Schottky diodes with variable bias, vol.93, p.262106, 2008.
TEM observation of crack-and pit-shaped defects in electrically degraded GaN HEMTs, IEEE Electron Device Lett, vol.29, issue.10, pp.1098-1100, 2008. ,
Evolution of structural defects associated with electrical degradation in AlGaN/GaN high electron mobility transistors, Appl. Phys. Lett, vol.96, issue.23, p.233509, 2010. ,
Fully-coupled electromechanical analysis of stress-related failure in GaN HEMTs, Phys. status solidi, vol.8, issue.7-8, pp.2276-2278, 2011. ,
Fully coupled thermoelectromechanical analysis of GaN high electron mobility transistor degradation, J. Appl. Phys, vol.111, issue.7, pp.74504-74505, 2012. ,
Role of oxygen in the OFF-state degradation of AlGaN/GaN high electron mobility transistors, Appl. Phys. Lett, vol.99, issue.22, p.223506, 2011. ,
Impact of WaterAssisted Electrochemical Reactions on the OFF-State Degradation of, IEEE Trans. Electron Devices, vol.61, issue.2, pp.437-444, 2014. ,
Effects of Surface Oxidation of AlGaN on DC Characteristics of AlGaN/GaN High-Electron-Mobility Transistors, Jpn. J. Appl. Phys, vol.48, issue.2R, p.20203, 2009. ,
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors, Microelectron. Reliab, vol.52, pp.23-28, 2012. ,
Characterization of the gate oxide of an AlGaN/GaN high electron mobility transistor, Appl. Phys. Lett, vol.98, issue.12, p.122103, 2011. ,
Analyse électrique et en bruit basse fréquence et haute fréquence des technologies InAlN/GaN HEMTs en vue de la conception d'amplificateurs robustes faible bruit en bande Ka, 2014. ,
Hot carrier effects in AlGaAs/InGaAs high electron mobility transistors : Failure mechanisms induced by hot carrier testing, J. Appl. Phys, vol.82, issue.11, pp.5547-5554, 1997. ,
Semiconductor Material and Device Characterization, 2006. ,
,
Hot electrons in group-III nitrides at moderate electric fields, Appl. Phys. Lett, vol.80, issue.13, pp.2317-2319, 2002. ,
Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems, Microelectron. Reliab, vol.49, issue.5, pp.474-477, 2009. ,
Impact of Hot Electrons on the Reliability of AlGaN/GaN High Electron Mobility Transistors, IEEE International Reliability Physics Symposium (IRPS), 2012. ,
The Study of Self-Heating and HotElectron Effects for AlGaN/GaN Double-Channel HEMTs, IEEE Trans. Electron Devices, vol.59, issue.5, pp.1393-1401, 2012. ,
Degradation of AlGaN/GaN HEMT devices: Role of reverse-bias and hot electron stress, Microelectron. Eng, vol.109, pp.257-261, 2013. ,
Electroluminescence and other diagnostic techniques for the study of hot-electron effects in compound semiconductor devices, J. Cryst. Growth, vol.210, issue.1, pp.331-340, 2000. ,
Field and hot electron-induced degradation in GaN-based power MISHEMTs, Microelectron. Reliab, vol.76, pp.282-286, 2017. ,
Secondary Electroluminescence of GaN-on-Si RF HEMTs: Demonstration and Physical Origin, IEEE Trans. Electron Devices, vol.64, issue.3, pp.1032-1037, 2017. ,
Hot-Carrier Degradation in GaN HEMTs Due to Substitutional Iron and Its Complexes, IEEE Trans. Electron Devices, vol.63, issue.4, pp.1486-1494, 2016. ,
Spatially-resolved spectroscopic measurements of Ec-0.57 eV traps in AlGaN/GaN high electron mobility transistors, Appl. Phys. Lett, vol.102, issue.19, p.193509, 2013. ,
Toward a physical understanding of the reliability-limiting Ec-0.57 eV trap in GaN HEMTs, IEEE International Reliability Physics Symposium (IRPS), 2014. ,
Simulation of Hot Electron and Quantum Effects in AlGaN/GaN Heterostructure Field Effect Transistors, J. Appl. Phys, vol.95, issue.11, pp.6409-6413, 2004. ,
A Comprehensive Computational Modeling Approach for AlGaN/GaN HEMTs, IEEE Trans. Nanotechnol, vol.15, issue.6, pp.947-955, 2016. ,
Thermal Management of High Power Devices, CS Mantech, pp.1-3, 2013. ,
N-Polar GaN Cap MISHEMT With Record Power Density Exceeding 6.5 W/mm at 94 GHz, IEEE Electron Device Lett, vol.38, issue.3, pp.359-362, 2017. ,
Monte Carlo calculation of velocity-field characteristics of wurtzite GaN, J. Appl. Phys, vol.82, issue.4, pp.1649-1655, 1997. ,
Temperature and Doping Dependencies of the Transport Properties within GaN and GaAs, J. Mod. Phys, vol.2, issue.11, pp.1324-1330, 2011. ,
Comparison of Steady State Electron Transport Properties in Binary Nitride Materials Using Three Valley Monte Carlo Model, Leonardo J. Sci, issue.20, pp.71-78, 2012. ,
Electro-thermal modeling of multifinger AlGaN/GaN HEMT device operation including thermal substrate effects, Microelectron. Reliab, vol.48, issue.1, pp.45-50, 2008. ,
Benefits of Considering More than Temperature Acceleration for GaN HEMT Life Testing, Electronics, vol.5, issue.3, p.32, 2016. ,
AlGaN/GaN HFET Reliability, IEEE Microw. Mag, vol.10, issue.4, pp.116-127, 2009. ,
Electro-Thermal Reliability Study of GaN High Electron Mobility Transistors, IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm, pp.1247-1252, 2017. ,
Integrated Temperature Mapping of Lateral Gallium Nitride Electronics, IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm, pp.320-327, 2017. ,
Thermal evaluation of GaN-based HEMTs with various layer sizes and structural parameters using fi nite-element thermal simulation, Microelectron. Reliab, vol.74, pp.52-57, 2017. ,
Characterization of Dynamic Self-Heating in GaN HEMTs Using Gate Resistance Measurement, IEEE Electron Device Lett, vol.38, issue.2, pp.240-243, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-01914376
Characterization of AlGaN/GaN HEMTs Using Gate Resistance Thermometry, IEEE Trans. Electron Devices, vol.64, issue.1, pp.78-83, 2017. ,
Experimental Benchmarking of Electrical Methods and ?-Raman Spectroscopy for Channel Temperature Detection in AlGaN/GaN HEMTs, IEEE Trans. Electron Devices, vol.63, issue.6, pp.2321-2327, 2016. ,
Benchmarking of Thermal Boundary Resistance in AlGaN/GaN HEMTs on SiC Substrates: Implications of the Nucleation Layer Microstructure, IEEE Electron Device Lett, vol.31, issue.12, pp.1395-1397, 2010. ,
,
Thermal Boundary Resistance Between GaN and Substrate in AlGaN/GaN Electronic Devices, IEEE Trans. Electron Devices, vol.54, issue.12, pp.3152-3158, 2007. ,
Impact of Bias and Device Structure on Gate Junction Temperature in AlGaN/GaN-on-Si HEMTs, IEEE Trans. Electron Devices, vol.61, issue.5, pp.1327-1334, 2014. ,
Modeling Self-Heating Effects in AlGaN/GaN Electronic Devices during Static and Dynamic Operation Mode, IEEE Simulation of Semiconductor Processes and Devices (SISPAD), pp.233-236, 2014. ,
Characterization and Modeling of Semiconductor Power Devices Reliability, 2017. ,
Simulation of thermal management in AlGaN/GaN HEMTs with integrated diamond heat spreaders, Semicond. Sci. Technol, vol.28, issue.5, p.55010, 2013. ,
Thermal resistance optimization of GaN/substrate stacks considering thermal boundary resistance and temperature-dependent thermal conductivity, Appl. Phys. Lett, vol.109, issue.15, p.151904, 2016. ,
Effect of self-heating on electrical characteristics of AlGaN/GaN HEMT on Si (111) substrate, AIP Adv, vol.7, issue.8, p.85015, 2017. ,
Hot-Electron Degradation of AlGaN/GaN High-Electron Mobility Transistors During RF Operation: Correlation With GaN Buffer Design, IEEE Electron Device Lett, vol.36, issue.10, pp.1011-1014, 2015. ,
Effects of buffer compensation strategies on the electrical performance and RF reliability of AlGaN/GaN HEMTs, Microelectron. Reliab, vol.55, issue.9, pp.1662-1666, 2015. ,
Evidence for causality between GaN RF HEMT degradation and the EC-0.57 eV trap in GaN, Microelectron. Reliab, vol.56, pp.45-48, 2016. ,
Direct observation of 0.57 eV trap-related RF output power reduction in AlGaN/GaN high electron mobility transistors, Solid State Electron, vol.80, pp.19-22, 2013. ,
Electroluminescence of hot electrons in AlGaN/GaN high-electron-mobility transistors under radio frequency operation, Appl. Phys. Lett, vol.106, issue.21, p.213502, 2015. ,
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence, Microelectron. Reliab, vol.55, issue.12, pp.2493-2498, 2015. ,
Fiabilité des dispositifs à base de GaN 71 ,
Hot-Electron Electroluminescence Under RF Operation in GaN-HEMTs: A Comparison Among Operational Classes, IEEE Trans. Electron Devices, vol.64, issue.5, pp.2155-2160, 2017. ,
Hot electron generation under large-signal radio frequency operation of GaN high-electron-mobility transistors, Appl. Phys. Lett, vol.111, issue.1, p.13506, 2017. ,
GaN Ku-band low-noise amplier design including RF life test, Int. J. Numer. Model. Electron. Networks, Devices Fields, vol.28, issue.6, pp.717-731, 2015. ,
Self-biasing effects induced by RF step-stress in Kaband LNAs based on InAlN/GaN HEMT technology, IEEE Microwave Integrated Circuits Conference (EuMIC), pp.480-483, 2016. ,
URL : https://hal.archives-ouvertes.fr/hal-02088210
On the Recovery Time of Highly Robust Low-Noise Amplifiers, IEEE Trans. Microw. Theory Tech, vol.58, issue.4, pp.781-787, 2010. ,
Impact of Trapping Effects on the Recovery Time of GaN Based Low Noise Amplifiers, IEEE Microw. Wirel. Components Lett, vol.26, issue.1, pp.31-33, 2016. ,
De l'Etude en Bruit Basse Fréquence à la Conception d'un Oscillateur en Bande-X à partir de transistors AlGaN/GaN HEMT, 2007. ,
Design of a X-band GaN oscillator: from the low frequency noise device characterization and large signal modeling to circuit design, IEEE MTT-S International Microwave Symposium (IMS, pp.747-750, 2006. ,
URL : https://hal.archives-ouvertes.fr/hal-00128228
Generation-recombination defects in AlGaN/GaN HEMT on SiC substrate, evidenced by low frequency noise measurements and SIMS characterization, AIP Conference Proceedings, vol.922, pp.163-166, 2007. ,
URL : https://hal.archives-ouvertes.fr/hal-00272560
, GaN Reliability Enhancement and Technology Transfer Initiative, pp.1-8
ESA perspective on the industrialisation of European GaN technology for space application, IEEE European Microwave Integrated Circuit Conference (EuMIC), pp.233-236, 2014. ,
High efficiency and low leakage AlGaN/GaN HEMTs for a robust , reproducible and reliable X-band MMIC space technology, IEEE Transactions on Semiconductor Manufacturing (CS-MANTECH), pp.1-4, 2010. ,
High efficiency X-band AlGaN/GaN MMICs for space applications with lifetimes above 10^5 hours, IEEE European Microwave Integrated Circuit Conference (EuMIC), pp.123-126, 2012. ,
Preliminary Reliability Data from Accelerated RF Life Tests on European GaN HEMTs, IEEE Transactions on Semiconductor Manufacturing, pp.24-27, 2012. ,
RF Power Degradation of GaN High Electron Mobility Transistors, IEEE International Electron Devices Meeting (IEDM), 2010. ,
Understanding Traps Locations and Impact on AlGaN/GaN HEMT by LFN noise & transient measurements, and T-CAD simulations, IEEE International Conference on Noise and Fluctuation (ICNF, pp.1-4, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-02087930
Physical analysis of Schottky contact on power AlGaN/GaN HEMT after pulsed-RF life test, Microelectron. Reliab, vol.52, issue.9, pp.2205-2209, 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-00735905
Compared deep class-AB and class-B ageing on AlGaN/GaN HEMT in SBand pulsed-RF operating life, Microelectron. Reliab, vol.52, issue.11, pp.2561-2567, 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-00735899
Lifetesting GaN HEMTs with Multiple Degradation Mechanisms, IEEE Trans. Device Mater. Reliab, vol.15, issue.4, pp.486-494, 2015. ,
Reliability data's of 0.5 µm AlGaN/GaN on SiC technology qualification, Microelectron. Reliab, vol.52, issue.9, pp.2200-2204, 2012. ,
Obsolescence of the MIL-HDBK-217: A critical review, IEEE International Workshop on Metrology fo AeroSpace, pp.282-286, 2017. ,
Revision of MIL-HDBK-217 , Reliability Prediction of Electronic Equipment, Proceedings of the IEEE Reliability and Maintainability Symposium (RAMS), pp.1-3, 2010. ,
Enhancing MIL-HDBK-217 Reliability Predictions with Physics of Failure Methods, Proceedings of the IEEE Reliability and Maintainability Symposium (RAMS), pp.1-6, 2010. ,
Reliability Predictions to Support a Design For Reliability Program, Proceedings of the IEEE Reliability and Maintainability Symposium (RAMS), pp.1-4, 2011. ,
Reliability Roadmap and Industry Collaboration, Proceedings of the IEEE Reliability and Maintainability Symposium (RAMS), pp.1-5, 2013. ,
Fiabilité des dispositifs à base de GaN 73 ,
, Reliability Methodology for Electronic Systems, Guide FIDES, pp.1-465, 2010.
The Effect of RF-Driven Gate Current on DC/RF Performance in GaAs pHEMT MMIC Power Amplifiers, IEEE Trans. Microw. Theory Tech, vol.53, issue.11, pp.3398-3406, 2005. ,
A complete RF power technology assessment for military applications, Microelectron. Reliab, vol.46, issue.9, pp.1817-1822, 2006. ,
RF Power Degradation of GaN High Electron Mobility Transistors, IEEE International Electron Devices Meeting (IEDM), 2010. ,
Preliminary Reliability Data from Accelerated RF Life Tests on European GaN HEMTs, IEEE Transactions on Semiconductor Manufacturing, pp.87-90, 2012. ,
Electrical and Physical Analysis of Thermal Degradations of AlGaN/GaN HEMT Under Radar-Type Operating Life, IEEE Trans. Microw. Theory Tech, vol.64, issue.3, pp.756-766, 2016. ,
URL : https://hal.archives-ouvertes.fr/hal-01299413
Fundamentals of RF and Microwave Power Measurements, 2017. ,
Microwave engineering, 2012. ,
Self-Biasing Effects Induced by RF Step-Stress in Ka-Band LNAs based on InAlN/GaN HEMT Technology, IEEE European Microwave Integrated Circuit Conference (EuMIC), pp.480-483, 2016. ,
URL : https://hal.archives-ouvertes.fr/hal-02088210
De l'Etude en Bruit Basse Fréquence à la Conception d'un Oscillateur en Bande-X à partir de transistors AlGaN/GaN HEMT, 2007. ,
Correlation between RF and DC reliability in GaN high electron mobility transistors, Reliab. Compd. Semicond. Work, pp.185-194, 2008. ,
Diagnostic Tools For Accurate Reliability Investigations of GaN Devices, 21st Int. Conf. Noise Fluctuations, pp.452-457, 2011. ,
URL : https://hal.archives-ouvertes.fr/hal-00907447
Microwave Field-Effect Transistors-1976, IEEE Trans. Microw. Theory Tech, vol.24, issue.6, pp.279-300, 1976. ,
Analyse et optimisation de transistors à effet de champ à hétérojonction pour l'amplification de puissance dans la bande Ka, 1995. ,
A New Method for Determining the FET Small-Signal Equivalent Circuit, IEEE Trans. Microw. Theory Tech, vol.36, issue.7, pp.1151-1159, 1988. ,
Correlation between transient evolutions of the gate and drain currents in AlGaN/GaN technologies, Microelectron. Reliab, vol.55, issue.9, pp.1714-1718, 2015. ,
URL : https://hal.archives-ouvertes.fr/hal-01234080
Handbook of Nitride Semiconductors and Devices, Materials Properties, Physics and Growth, 2009. ,
Electron affinity and surface states of GaN m-plane facets: Implication for electronic selfpassivation, Phys. Rev. B, vol.97, issue.11, p.115433, 2018. ,
Electronic states at aluminum nitride (0001)-1x1 surfaces, Appl. Phys. Lett, vol.74, issue.4, pp.546-548, 1999. ,
Band parameters for nitrogen-containing semiconductors, J. Appl. Phys, vol.94, issue.6, pp.3675-3696, 2003. ,
Electron and Hole Drift Velocity Measurements in Silicon and Their Empirical Relation to Electric Field and Temperature, IEEE Trans. Electron Devices, vol.22, issue.11, pp.1045-1047, 1975. ,
Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N-and Ga-face AlGaN/GaN heterostructures, J. Appl. Phys, vol.85, issue.6, pp.3222-3233, 1999. ,
The Impact of Defects on GaN Device Behavior: Modeling Dislocations, Traps, and Pits, ECS J. Solid State Sci. Technol, vol.5, issue.4, pp.3142-3148, 2016. ,
Statistics of the Recombinations of Holes and Electrons, Phys. Rev, vol.87, issue.5, pp.835-842, 1952. ,
Electron-Hole Recombination in Germanium, Phys. Rev, vol.87, issue.2, p.387, 1952. ,
Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging, Microelectron. Reliab, pp.344-349, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-02088137
en cours, 2018. ,
,
Polarization-induced charge and electron mobility in AlGaN/GaN heterostructures grown by plasma-assisted molecular-beam epitaxy, J. Appl. Phys, vol.86, issue.8, pp.4520-4526, 1999. ,
Polarization effects, surface states, and the source of electrons in AlGaN/GaN heterostructure field effect transistors, Appl. Phys. Lett, vol.77, issue.2, pp.250-252, 2000. ,
Deep traps in GaN-based structures as affecting the performance of GaN devices, Mater. Sci. Eng. R, vol.94, pp.1-56, 2015. ,
Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs, IEEE Electron Device Lett, vol.35, issue.1, pp.27-29, 2014. ,
Recessed-Gate Structure Approach Toward Normally Electronics Applications, IEEE Trans. Electron Devices, vol.53, issue.2, pp.356-362, 2006. ,
Elaboration d'hétérostructures (Al,Ga)N/GaN en vue d'applications électroniques : de la croissance cristalline au composant, Habilitation à Diriger des Recherches, 2007. ,
Formation of two-dimensional electron gas at AlGaN/GaN heterostructure and the derivation of its sheet density expression *, Chinese Phys. B, vol.24, issue.6, p.67301, 2015. ,
Analytical Model for Schottky Barrier Height and Threshold Voltage of AlGaN/GaN HEMTs With Piezoelectric Effect, IEEE Trans. Electron Devices, vol.65, issue.3, pp.901-907, 2018. ,
A review of recent MOSFET threshold voltage extraction methods, Microelectron. Reliab, vol.42, issue.4-5, pp.583-596, 2002. ,
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications, Microelectron. Reliab, vol.76, pp.292-297, 2017. ,
Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental tools -Electrical and T-CAD models, IEEE Mediterranean Electrotechnical Conference (MELECON), pp.237-242, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01877587
, La conception est réalisée selon les étapes suivantes
, Création du réseau de polarisation pour les accès de polarisation de grille et de drain au plus près du transistor (limitation des risques d'oscillation)
, Modélisation de l'effet de la longueur des fils (wire bonding) de microcâblage utilisés pour relier les accès du transistor avec le circuit
, IMN : Input Matching Network) pour l'obtention du gain en puissance maximum du transistor ; impédance conjuguée ramenée par la charge d'entrée 50 ? et l'IMN
, OMN : Output Matching Network) pour optimiser le transfert de puissance vers la charge de sortie 50? ; impédance conjuguée ramenée par la charge de sortie et l'OMN
, Vérification des performances avec les autres transistors et ajustement des réseaux si nécessaire
Correlation between DC and rf degradation due to deep levels in AlGaN/GaN HEMTs, Electron Devices Meet, pp.1-4, 2009. ,
RF Power Degradation of GaN High Electron Mobility Transistors, IEEE International Electron Devices Meeting (IEDM), 2010. ,
Reliability of compound semiconductor devices for space applications, Microelectron. Reliab, vol.39, issue.12, pp.1723-1736, 1999. ,
Characterization of Dynamic Self-Heating in GaN HEMTs Using Gate Resistance Measurement, IEEE Electron Device Lett, vol.38, issue.2, pp.240-243, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-01914376
Stability and Power-Gain Invariants of Linear Twoports *, IRE Trans. Circuit Theory, vol.9, issue.1, pp.29-32, 1962. ,
A New Criterion for Linear 2-Port Stability Using a Single Geometrically Derived Parameter, IEEE Trans. Microw. Theory Tech, vol.40, issue.12, pp.2303-2311, 1992. ,
A review of recent MOSFET threshold voltage extraction methods, Microelectron. Reliab, vol.42, issue.4-5, pp.583-596, 2002. ,
Gate defects analysis in AlGaN/GaN devices by mean of accurate extraction of the Schottky Barrier Height, electrical modelling, T-CAD simulations and TEM imaging, Conférences internationales, pp.344-349, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-02088137
Fully automated RF-thermal stress workbench with S-parameters tracking for GaN reliability analysis, IEEE European Microwave Integrated Circuit Conference (EuMiC), pp.1-4, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-02088200
Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental toolsElectrical and T-CAD models, IEEE Mediterranean Electrotechnical Conference (MELECON), pp.237-242, 2018. ,
URL : https://hal.archives-ouvertes.fr/hal-01877587
Understanding Traps Locations and Impact on AlGaN/GaN HEMT by LFN noise & transient measurements, and T-CAD simulations, IEEE International Conference on Noise and Fluctuation, 2017. ,
URL : https://hal.archives-ouvertes.fr/hal-02087930
Mise en oeuvre d'une méthode d'analyse de défaillance de circuits GaN par rétro-simulation physique TCAD, Journées Nationales Microondes, pp.1-4, 2017. ,