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. , Table des matières Chapitre 5. Études électriques et optiques des pixels-détecteurs

.. .. Rappels, 170 Contact Schottky : hauteur de barrière et densité de courant

D. .. Mesures-en-transport-Électrique,

C. Schottky and .. .. ,

. .. Réponse-fréquentielle-Électrique,

. , Rappels sur la conduction dans les semi-conducteurs amorphes

. .. Mécanismes-de-conduction-dans-a-ybco,

.. .. Origines,

.. .. Matériaux,

. , Discussion de l'effet pyroélectrique dans YBCO

.. .. Mises-en-Évidence-de-l&apos;effet-pyroélectrique,

. , Réfutation d'autres effets physiques possibles

. , Méthodes de détermination des paramètres thermiques

. .. Récapitulatif,

. .. Réponses-fréquentielles-optiques,

. .. Modèle-pyroélectrique-standard,

.. .. Origines-du-courant-capacitif,

. .. Considérations-géométriques-qualitatives,

.. .. Limites-du-modèle-pyroélectrique-standard,

. , Modélisation avancée du détecteur pyroélectrique

. .. Dépendance-fréquentielle,

. , Application à un pixel-détecteur planaire

. .. Étude-du-bruit,

. .. Rappels,

. .. Bruit-de-johnson,

. .. Bruit-de-grenaille,

. , Mesures du bruit des pixels-détecteurs

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, 300 K) et une fréquence de relaxation haute fdip ? 20 KHz (à 300 K) selon le modèle de Debye, vol.47

L. Ainsi and . Terme,

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A. J. Kreisler, X. Galiano, V. S. Jagtap, D. Alamarguy, and A. F. Dégardin, Low noise and fast response of IR sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon, Conference of the European Materials Science Society (E-MRS 2015), pp.11-15, 2015.
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A. F. Dégardin, X. Galiano, V. S. Jagtap, and A. J. Kreisler, Fast and Sensitive Response of Semiconducting Y-Ba-Cu-O Detectors; Consideration for THz Imaging Arrays, Joint Symposium of the 3 rd International Symposium on Microwave/THz Science and Applications (MTSA 2015) and the 6 th International Symposium on Terahertz Nanoscience (TeraNano-6), pp.1-11, 2015.

P. Galiano, A. Kreisler, V. Jagtap, and A. Dégardin, Détecteurs thermiques en Y-Ba-Cu-O semi-conducteur : réponse rapide et faible bruit en infrarouge-développement de futurs dispositifs THz, 13èmes Journées de Caractérisation Micro-ondes et Matériaux (JCMM 2014), pp.24-26, 2014.