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Étude de la fiabilité des structures silicium employées dans le domaine des énergies renouvelables suite à leur fonctionnement sous conditions extrêmes

Abstract : The objective of this work aim to study the performance, reliability of semiconductor structures after their operation under extreme conditions, during and after electrical stress, thermal stress, and combined electro thermal stresses. The studied semiconductor structures are photovoltaic cells for applications in the field of renewable energies. These devices have been exposed to several types of degradation generating localized defects in the structures. The I (V) and C (V) characteristics and electrical parameters have been studied before and after each stress case. The Deep Level Transient Spectroscopy (DLTS) was used as advanced technique for tracking the defects created at the interface and in the bulk structures. The DLTS technique allows identifying and locating these defects within the devices, by determining their activation energy and their capture cross-Section
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https://tel.archives-ouvertes.fr/tel-01809977
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Submitted on : Thursday, June 7, 2018 - 12:49:05 PM
Last modification on : Friday, April 10, 2020 - 2:10:55 AM
Long-term archiving on: : Saturday, September 8, 2018 - 1:10:36 PM

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DDOC_T_2017_0244_ZARAKET.pdf
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  • HAL Id : tel-01809977, version 1

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Jean Gerges Zaraket. Étude de la fiabilité des structures silicium employées dans le domaine des énergies renouvelables suite à leur fonctionnement sous conditions extrêmes. Optique [physics.optics]. Université de Lorraine; Université libanaise, 2017. Français. ⟨NNT : 2017LORR0244⟩. ⟨tel-01809977⟩

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