Analyse multimodale et multicritères pour l'expertise et la localisation de défauts dans les composants électroniques modernes

Abstract : The purpose of this manuscript is to exhibit the research work solving the issue of data processing stem from defect localization techniques. This step being decisive in the failure analysis process, scientists have to harness data coming from light emission and laser techniques. Nevertheless, this analysis process is sequential and only depends on the expert’s decision. This factor leads to a not quantified probability of localization. Consequently to solve these issues, a multimodal and multicriteria analysis has been developped, taking advantage of the heterogeneous and complementary nature of light emission and laser probing techniques. This kind of process is based on advanced level tools such as signal/image processing and data fusion. The final aim being to provide a quantitive and qualitative decision help for the experts. The first part of this manuscript is dedicated to the description of the entire process for 1D and 2D data enhancement. Thereafter, the spatio-temporal analysis of laser probing waveforms will be tackled. Finally, the last part highlights the decision support brought by data fusion.
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Contributor : Anthony Boscaro <>
Submitted on : Monday, March 12, 2018 - 2:21:23 PM
Last modification on : Friday, December 7, 2018 - 4:48:04 PM
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Anthony Boscaro. Analyse multimodale et multicritères pour l'expertise et la localisation de défauts dans les composants électroniques modernes. Traitement du signal et de l'image [eess.SP]. Université de Bourgogne, 2017. Français. ⟨tel-01729206⟩

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