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Image fluctuations in cascade intensifiers, British Journal of Applied Physics, vol.10, issue.5, p.233, 1959. ,
DOI : 10.1088/0508-3443/10/5/309
Lattice variation maps for, p.91 ,
18 Overview image of GaN NWs, p.104 ,
Interfacial chemistry in a ZnTe/CdSe superlattice studied by atom probe tomography and transmission electron microscopy strain measurements, Journal of Microscopy, vol.136, issue.11, p.178, 2016. ,
DOI : 10.1016/j.ultramic.2013.07.018
URL : https://hal.archives-ouvertes.fr/hal-01390785
The influence of AlN buffer over the polarity and the nucleation of self-organized GaN nanowires, Journal of Applied Physics, vol.117, issue.24, p.245303, 2015. ,
DOI : 10.1016/j.jcrysgro.2013.01.031
URL : https://hal.archives-ouvertes.fr/hal-01226735
Attribution of the 3.45???eV GaN nanowires luminescence to inversion domain boundaries, Applied Physics Letters, vol.107, issue.5, p.51904, 2015. ,
DOI : 10.1103/PhysRevB.69.085204
URL : https://hal.archives-ouvertes.fr/hal-01586122
InGaN nanowires with high InN molar fraction: growth, structural and optical properties, Nanotechnology, vol.27, p.195704, 2016. ,
Growth mechanism of InGaN nano-umbrellas, Nanotechnology, vol.27, issue.45, p.455603, 2016. ,
DOI : 10.1088/0957-4484/27/45/455603
-plane GaN/AlGaN heterostructures with intersubband transitions in the 5???10 THz band, Nanotechnology, vol.26, issue.43, p.435201, 2015. ,
DOI : 10.1088/0957-4484/26/43/435201
Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography, Nanoscale Research Letters, vol.11, issue.1, p.461, 2016. ,
DOI : 10.1016/j.ultramic.2006.06.008
URL : https://hal.archives-ouvertes.fr/hal-01385434
High Precision Strain Mapping of Topological Insulator HgTe, pp.sub- mitted ,
Strain mapping from two-dimensional scanning moiré patterns in [110] zone axis ,
Direct comparison of differential phase contrast and off-axis electron holography ,
Simultaneous electric field and strain measurements of a-plane AlN, preparation Journal Covers List of Tables Patents ,
Méthode de détermination de la réflexion d'un faisceau d'électrons resultant d'un champ électrique et/ou d'un champ magnétique', patent pending, 2016. ,
Direct comparison of differential phase contrast and off-axis electron holography for the measurement of electric potentials by the examination of reverse biased Si p-n junctions and III-V samples, European Microscopy Congress 2016 ,
Rouvière 'Picometre-precision atomic structure of inversion domain boundaries in GaN, European Microscopy Congress 2016 ,