Développement d'un système de microscopie en champ proche térahertz

Abstract : This work presents results on terahertz near-field microscopy using two types of probes. The first probe is mainly sensitive to the transverse component of the electric field. The second probe, whichis a sensitive to the longitudinal componen Ez, was coupled to a study of guided modes on cylindrical waveguide. This work comprises electromagnetic FDTD simulations and experiments.
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  • HAL Id : tel-01316243, version 1

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Jean-Paul Guillet. Développement d'un système de microscopie en champ proche térahertz. Electromagnétisme. Université de Montpellier, 2010. Français. ⟨tel-01316243⟩

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