Skip to Main content Skip to Navigation

Développement d'un système de microscopie en champ proche térahertz

Abstract : This work presents results on terahertz near-field microscopy using two types of probes. The first probe is mainly sensitive to the transverse component of the electric field. The second probe, whichis a sensitive to the longitudinal componen Ez, was coupled to a study of guided modes on cylindrical waveguide. This work comprises electromagnetic FDTD simulations and experiments.
Complete list of metadata

Cited literature [47 references]  Display  Hide  Download
Contributor : Jean-Paul Guillet <>
Submitted on : Thursday, May 19, 2016 - 1:15:02 AM
Last modification on : Tuesday, January 19, 2021 - 11:58:40 AM
Long-term archiving on: : Saturday, August 20, 2016 - 10:17:38 AM


  • HAL Id : tel-01316243, version 1


Jean-Paul Guillet. Développement d'un système de microscopie en champ proche térahertz. Electromagnétisme. Université de Montpellier, 2010. Français. ⟨tel-01316243⟩



Record views


Files downloads