Skip to Main content Skip to Navigation

Analyse par ToF-SIMS de matériaux organiques pour les applications en électronique organique

Abstract : During the last decade, organic electronics have developed rapidly. However, the production of organic electronic devices is still impeded because of various technological barriers. Such systems have specific analytical needs and time-of-flight secondary ion mass spectrometry (ToF-SIMS) is per se highly relevant, particularly when considering the use of a new type of ion source based on argon clusters (Arn +). The main objective of this work was therefore to understand the ion-matter interactions of such a cluster beam with the organic materials used in organic electronics. A fundamental study was carried out by comparing sputtering with three different ion beams (Cs+, C60 ++, Arn +) on organic structured samples (such as PS-b-PMMA block copolymers) and it transpired that although cluster size and energy has little effect on the observable damage to the sample, larger argon clusters induce more roughness during ToFSIMS depth profiling. This was confirmed by AFM (Atomic Force Microscopy) and XPS (Xray Photoelectron Spectroscopy) and a geometric model. Next, different devices in organic electronics were characterized by ToF-SIMS. The study of self-assembling PS-b-PMMA block copolymers made possible to evaluate the influence of the annealing duration and of the thickness of the layer. Furthermore, a protocol was developed to analyse stacks of inorganic/organic layers, in particular those contained in OLED devices. It was then possible to characterize the stacks of a complete organic light-emitting device whilst maintaining molecular signal and a high depth resolution of 2 nm. In parallel we identified the chemical degradation of an organic material in the stack and evaluated the efficiency of barrier layers designed to protect it. More precisely, specific signatures to the hydrolysis reaction of the layer as well as increase in moisture level after encapsulation were identified
Complete list of metadata

Cited literature [176 references]  Display  Hide  Download
Contributor : Abes Star :  Contact
Submitted on : Tuesday, May 10, 2016 - 7:01:37 PM
Last modification on : Tuesday, June 15, 2021 - 2:30:15 PM
Long-term archiving on: : Wednesday, May 25, 2016 - 8:57:58 AM


Version validated by the jury (STAR)


  • HAL Id : tel-01314142, version 1



Tanguy Terlier. Analyse par ToF-SIMS de matériaux organiques pour les applications en électronique organique. Science des matériaux [cond-mat.mtrl-sci]. Université Claude Bernard - Lyon I, 2015. Français. ⟨NNT : 2015LYO10165⟩. ⟨tel-01314142⟩



Record views


Files downloads