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Détermination des coefficients d'ionisation de matériaux à grand gap par génération multi-photonique

Abstract : In the last few decades, the use of wide bandgap (WBG) semiconductors (silicon carbide SiC, gallium nitride GaN, diamond, etc…) has become popular in the domain of power electronics. Their electronic and mechanical characteristics made of the WBGs a good alternative to the traditional silicon. However, additional studies are mandatory to improve the breakdown voltage, static and dynamic losses, and the performance at high temperature of the WBG devices. In this context, two specific experimental benches OBIC (Optical Beam Induced Current) -under development- are set up during this thesis. OBIC method consists to generate free charge carriers in a reverse biased junction by illuminating the device with an appropriate wavelength. An OBIC signal is measured if the charge carriers are generated in the space charge region. After a first phase of preparation and adaptation of the experimental environment, OBIC measurements led to demonstrate the multi-photonic generation by illuminating a SiC junction with a green laser (532 nm). OBIC measurements allowed giving an image of the electric field at the surface of the diode: OBIC presents a non-destructive analysis to study the efficiency of the peripheral protection and to detect the defects in the semi-conductor. Minority carrier lifetime was also deduced by studying the OBIC decrease at the edge of the space charge region. Ionization rates were extracted using OBIC method; these coefficients are key parameters to predict the breakdown voltage of the devices. OBIC measurements were also realized on the GaN, and two-photon generation was highlighted by measuring an OBIC current in the diamond when illuminating it with a UV laser beam (349 nm).
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Hassan Hamad. Détermination des coefficients d'ionisation de matériaux à grand gap par génération multi-photonique. Electronique. INSA de Lyon, 2015. Français. ⟨NNT : 2015ISAL0017⟩. ⟨tel-01309165⟩

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