Étude et contrôle cohérent du champ proche optique de milieux diélectriques désordonnés et de films semi-continus métal-diélectriques

Abstract : One important challenge to address in the optical field is a better understanding of the optical near field of systems and how we can interact with them from the far-field. It is in this regard that I studied and controlled of the near field of both 3D disordered dielectric media and metal-dielectric disordered films. For 3D media, we used a near-field microscope to measure the optical field on their surface. To reach a free-artefact measure, we had to carefully prepare the sample by minimising the rugosity. In a second part, we studied optical modes on metal-dielectric films et we showed that it exists extended modes for some specific values of metal filling fraction of the sample. Extension of the modes has been quantified by measuring the interaction length and has been found in the order of 10 $\mu$m, enough to allow a far field control of the modes. These measurements opened the way for wavefront control of the incident beam in order to focus light in the near field of the sample. We use a spatial light modulator to control the incident wavefront and a non-linear signal (two photons luminescence - TPL) for the near-field measurement of the optical field. We could reach focusing of the energy by a factor more than ten. Finally, the SNOM technique has been coupled to the wavefront shaping system and we get preliminary measurements of optimisation in the near-field by this technique.
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Pierre Bondareff. Étude et contrôle cohérent du champ proche optique de milieux diélectriques désordonnés et de films semi-continus métal-diélectriques. Optique [physics.optics]. Université Pierre et Marie Curie - Paris VI, 2014. Français. ⟨NNT : 2014PA066697⟩. ⟨tel-01275720⟩

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