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Development of predictive models for electromagnetic robustness of electronic components

He Huang 1
1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : One important objective of the electromagnetic compatibility (EMC) studies is to make the products compliant with the EMC requirement of the customers or the standards. However, all the EMC compliance verifications are applied before the delivery of final products. So we might have some new questions about the EMC performance during their lifetime. Will the product still be EMC compliant in several years? Can a product keep the same EMC performance during its whole lifetime? If not, how long the EMC compliance can be maintained? The study of the long-term EMC level, which is called “electromagnetic robustness”, appeared in the recent years. Past works showed that the degradation caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. In this study, the long-term evolution of the EMC levels of two electronic component groups has been studied. The first electronic component type is the integrated circuit. The high-frequency currents and voltages during the switching activities of ICs are responsible for unintentional emissions or coupling. Besides, ICs are also very often the victim of electromagnetic interference. Another group of components is the passive component. In an electronic system, the IC components usually work together with the passive components at PCB level. The functions of passive components in an electronic system, such as filtering and decoupling, also have an important influence on the EMC levels. In order to analyze the long-term evolution of the EMC level of the electronic components, the study in this thesis tends to propose general predictive methods for the electromagnetic compatibility levels of electronic components which evolve with time.
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Contributor : Arlette Evrard <>
Submitted on : Monday, January 25, 2016 - 1:57:52 PM
Last modification on : Thursday, June 10, 2021 - 3:01:40 AM
Long-term archiving on: : Tuesday, April 26, 2016 - 10:53:49 AM


  • HAL Id : tel-01261471, version 1


He Huang. Development of predictive models for electromagnetic robustness of electronic components . Micro and nanotechnologies/Microelectronics. Institut national des sciences appliquées de Toulouse, 2015. English. ⟨tel-01261471⟩



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