INTERACTION LASER-NANOPOINTE SOUS CHAMP ELECTRIQUE INTENSE : APPLICATION A LA SONDE ATOMIQUE

Abstract : The goal of this work is a better understanding of the different physical processes which occurs during field evaporation of atoms. There is some considerations applied both to metalic and non-metalic case and with the atom probe tomography analysis technik. This work allows us to use different parameters to optimize the experimental condictions in atom probe to obtain the best results avaible.
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https://tel.archives-ouvertes.fr/tel-01095529
Contributor : Laurent Arnoldi <>
Submitted on : Monday, December 15, 2014 - 5:15:01 PM
Last modification on : Thursday, May 16, 2019 - 1:18:02 PM
Long-term archiving on : Monday, March 16, 2015 - 12:31:38 PM

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  • HAL Id : tel-01095529, version 1

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Laurent Arnoldi. INTERACTION LASER-NANOPOINTE SOUS CHAMP ELECTRIQUE INTENSE : APPLICATION A LA SONDE ATOMIQUE. Science des matériaux [cond-mat.mtrl-sci]. Université de Rouen, 2014. Français. ⟨tel-01095529⟩

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