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Développement d'une méthodologie de caractérisation et de modélisation de l'impact des décharges électrostatiques sur les systèmes électroniques

Nicolas Monnereau 1
1 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : During their use, electronic products are subjected to electrostatic discharge (in English: ESD - ElectroStatic Discharge) can induce errors operations and / or destruction. To overcome such shortcomings, tests are carried out in the following industry different standards, such as ISO10605 or IEC61000-4-2 for cars. When product failure is revealed, there is no tool, no method to analyze or predict the behavior of the system. Designers need to redesign the product until it meets the requirements of the standard or customers, without sufficient investigation methods for understanding the mechanisms of degradation during discharge. This can lead to numerous designs before finding a solution that is not necessarily the most efficient and most economical. The work presented in this paper are oriented on the development of modeling methods and characterization of a system for analyzing and understanding the patterns of spread and failure occurs when an electrostatic discharge on an electronic map. Given the levels of complexity that must be managed for a complete system, the modeling methodology implementation is based on a hierarchical behavioral description using VHDL-AMS language. This method is intended to analyze the spread of the discharge current in a system from an ESD generator to internal phenomena to the chip. In parallel we have had to develop, based on existing methods, measurement techniques allow more sophisticated than those available in standard investigation. The measurements obtained using these techniques to make correlations with simulations. This whole approach was validated through three case studies. Through these methods this thesis provides system designers with the tools to analyze the impact of ESD phenomenon in a system both from a strength point of view that susceptibility.
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Submitted on : Friday, September 26, 2014 - 10:55:14 AM
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  • HAL Id : tel-01068707, version 1


Nicolas Monnereau. Développement d'une méthodologie de caractérisation et de modélisation de l'impact des décharges électrostatiques sur les systèmes électroniques. Energie électrique. Université Paul Sabatier - Toulouse III, 2011. Français. ⟨tel-01068707⟩



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