Skip to Main content Skip to Navigation
Theses

DEVELOPPEMENT ET APPLICATIONS DE TECHNIQUES LASER IMPULSIONNELLES POUR L'ANALYSE DE DEFAILLANCE DES CIRCUITS INTEGRES

Abstract : The fault location based on laser stimulation are now among the most advanced available techniques. They allow thermal or photoelectric stimulation localized without physical contact. This Ph.D works was devoted to the development and application of techniques using pulsed laser for integrated circuits' analyses. Material development and investigation of analysis methodologies have been held by the motivation of the MADISON project (Methods of Analysis of Failures by Innovative Dynamic Optical Stimulation), which aims to increase the success rate analysis of complex circuits VLSI by laser stimulation. We used high-performance optical systems including fibered pulsed laser sources to explore the capabilities in terms of analysis by photoelectric laser stimulation. An original study of the Latchup phenomenon showed an improving lateral resolution by using nonlinear absorption process.
Document type :
Theses
Complete list of metadatas

Cited literature [28 references]  Display  Hide  Download

https://tel.archives-ouvertes.fr/tel-00997458
Contributor : Frédéric Darracq <>
Submitted on : Wednesday, May 28, 2014 - 11:00:52 AM
Last modification on : Thursday, January 11, 2018 - 6:21:09 AM
Document(s) archivé(s) le : Thursday, August 28, 2014 - 12:05:46 PM

Identifiers

  • HAL Id : tel-00997458, version 1

Citation

Emeric Faraud. DEVELOPPEMENT ET APPLICATIONS DE TECHNIQUES LASER IMPULSIONNELLES POUR L'ANALYSE DE DEFAILLANCE DES CIRCUITS INTEGRES. Electronique. Université Sciences et Technologies - Bordeaux I, 2012. Français. ⟨tel-00997458⟩

Share

Metrics

Record views

237

Files downloads

372