Technique for Fast Measurement of Gaussian Laser Beam Parameterss, Applied Optics, vol.10, pp.2275-2276, 1971. ,
(olma, Satellite anomalies from galactic cosmic rayss, IEEE Trans. Nuclear Science NS, vol.22, issue.6, pp.2675-2680, 1975. ,
Single sharp spot in fluorescence microscopy of two opposing lensess, Appl. Phys. Lett, vol.ell, pp.79-2321, 2001. ,
Two-photon absorption and Kerr coefficients of silicon for 850???2200nm, Applied Physics Letters, vol.90, issue.19, p.191104, 2007. ,
DOI : 10.1063/1.2737359
Soft defect localization SDLL in integrated circuits using laser scanning microscopy, Lasers and Electro-Optics Society, The 16th Annual Meeting of the IEEE, pp.662-663, 2003. ,
Techniques for measuring 1-??m diam Gaussian beams, Applied Optics, vol.23, issue.4, pp.637-340, 1984. ,
DOI : 10.1364/AO.23.000637
(enderson, Novel Failure Analysis Techniques Using Photon Probing With a Scanning Optical Microscopee, IEEE Proceeding of the 32nd International Reliability Physics Symposium, pp.388-398, 1994. ,
Light-induced voltage alteration for integrated circuit analysis » US. Brevet 5430305, 1995. ,
(igh-Contrast Images of Semiconductor Sites Via One-Photon Optical Beam?Induced Current Imaging and Confocal Reflectance Microscopy, Applied Optics, vol.41, pp.4157-4161, 2002. ,
Two-photon laser scanning fluorescence microscopy, Science, vol.248, issue.4951, pp.73-76, 1990. ,
DOI : 10.1126/science.2321027
Time Resolved Photon Emission Processing Flow for )C Analysiss, Microelectronics and reliability, vol.44, pp.1655-1662, 2004. ,
Z-scan measurements of the anisotropy of nonlinear refraction and absorption in crystalss ,
Focusing light to a tighter spott, pp.179-180, 2000. ,
Sharper Focus for a Radially Polarized Light Beamm, Phys. Rev. Lett, pp.91-233901, 2003. ,
Picosecond Timing Analysis in )ntegrated Circuits with Pulsed Laser Stimulationn, Reliability physics symposium proceedings, 2007. ,
Zur Elektronentheorie der Metalle, Annalen der Physik, vol.69, issue.3, pp.566-613, 1900. ,
DOI : 10.1002/andp.19003060312
Spatial homogeneity of optically switched semiconductor photonic crystals and of bulk semiconductorss Advanced L)VA/T)VA Techniquess, IEEE Proceedings of 27th International Symposium for Testing and Failure Analysis, pp.59-65, 2001. ,
Super gain antennas and optical resolving powerr, Nuovo Cimento, vol.9, pp.426-435, 1952. ,
(agness, Computational modeling of femtosecond optical solitons from Maxwell's equations, J. Quantum Electronics IEEE, vol.28, pp.2416-2422, 1992. ,
Silicon optical modulatorss Annular ouverture twophoton excitation microscopyy, Materials Today Optics Communications, vol.8, issue.117, pp.40-50, 1995. ,
(igh spatial resolution subsurface microscopy, Appl. Phys. Lett, p.4071, 2001. ,
Geometrical Theory of Diffraction*, Journal of the Optical Society of America, vol.52, issue.2, pp.116-130, 1962. ,
DOI : 10.1364/JOSA.52.000116
Laser beams and resonatorss, Appl. Opt, vol.5, p.1550, 1966. ,
Pathak, A uniform geometrical theory of diffraction for an edge in a perfectly conducting surface, Proc. IEEE, pp.1448-1461, 1974. ,
Three-dimensional superresolution by annular binary filterss TPA Laser and (eavy-Ion SEE Testing : Complementary Techniques for SDRAM Single-Event Evaluationn, Optics Communications IEEE Transactions on Nuclear Science, vol.165, issue.56 6, pp.267-278, 1999. ,
Effects of switching from <> to <> channel orientation and tensile stress on n-channel and p-channel metal?oxide-semiconductor transistorss, Solid-State Electronics, vol.54, pp.461-474, 2010. ,
Effect of radial polarization and apodization on spot size under tight focusing conditionss, Optics Express, vol.16, pp.4567-4581, 2008. ,
Effect of polarization on a solid immersion lens of arbitrary thicknesss, J. Opt. Soc. Am, pp.28-903, 2011. ,
Maiman, Stimulated Optical Radiation in Ruby, Nature, vol.187, pp.493-494, 1960. ,
Axial gain resolution in optical sectioning fluorescence microscopy by shaded-ring filters, Optics Express, vol.11, issue.15, pp.1740-1745, 2003. ,
DOI : 10.1364/OE.11.001740
Alpha-particle-induced soft errors in dynamic memoriess, IEEE Trans. Electron Devices ED-26, issue.1, pp.2-9, 1979. ,
Demonstration of single-event effects induced by through-wafer two-photon absorptionn, Nuclear Science, IEEE Transactions, vol.51, pp.3553-3557, 2004. ,
New Capabilities of OB)RC( Method for Fault Localization and Defect Detectionn, Proceedings of Sixth Asian Test Symposium, pp.214-219, 1997. ,
Measurements of the Cl atom concentration in radio???frequency and microwave plasmas by two???photon laser???induced fluorescence: Relation to the etching of Si, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol.10, issue.4, pp.1071-1079, 1992. ,
DOI : 10.1116/1.578204
The formation of laser beams with pure azimuthal or radial polarizationn, Physics, vol.77, pp.3322-3324, 2000. ,
Picosecond imaging circuit analysis of leakage currents in CMOS circuits, Semiconductor Device Fundamentals 28th International Symposium for Testing and Failure Analysis, pp.387-390, 1996. ,
)nvestigation of the two-photon optical beam induced current effect in silicon integrated circuitss, Optics Communications, vol.221, 2000. ,
Three-dimensional nanometric sub-surface imaging of a silicon flip-chip using the two-photon optical beam induced current method, pp.47-1534, 2007. ,
A New Type of Secondary Radiationn, Nature, vol.121, p.501, 1928. ,
Silicon optical modulators, Materials Today, vol.8, issue.1, pp.40-50, 2005. ,
DOI : 10.1016/S1369-7021(04)00678-9
URL : http://doi.org/10.1016/s1369-7021(04)00678-9
First-principles calculations of nonlinear optical susceptibility of inorganic materials, Journal of Physics: Condensed Matter, vol.13, issue.2, pp.343-351, 2001. ,
DOI : 10.1088/0953-8984/13/2/311
Critical Timing Analysis in Microprocessors Using Near-IR Laser Assisted Device Alteration (LADA), International Test Conference, IEEE, p.246, 2003. ,
Free Carrier Absorption in Siliconn, IEEE J. SOLID-STATE CIRCUITS, vol.13, pp.180-187, 1978. ,
Optical absorption in heavily doped siliconn, Phys. Rev. B, pp.23-33 ,
nm resolution in subsurface optical imaging of silicon integrated-circuits using pupil-function engineering, Appl. Phys. Lett, vol.94, p.73113, 2009. ,
Two photon Xvariation Mapping Based on a Diode Pumped Femtosecond laserr ,
Sensitive measurement of optical nonlinearities using a single beamm, Quantum Electronics IEEE Journal, pp.26-760, 1990. ,
The Fast Illinois Solver Code: requirements and scaling properties, IEEE Computational Science and Engineering, vol.5, issue.3, pp.19-23, 1998. ,
DOI : 10.1109/99.714589
Measurement of the ??m sized radius of Gaussian laser beam using the scanning knife-edge, Applied Optics, vol.14, issue.12, pp.2809-2810, 1975. ,
DOI : 10.1364/AO.14.002809
Resistivity, mobility and impurity levels in GaAs, Ge, and Si at 300??K, Solid-State Electronics, vol.11, issue.6, pp.599-602, 1968. ,
DOI : 10.1016/0038-1101(68)90012-9
« Computational Electrodynamics : The Finite- Difference Time Domain method, 2000. ,
Direct time integration of Maxwellls equations in nonlinear dispersive media for propagation and scattering of femtosecond electromagnetic solitonss, Optics Letters, vol.17, pp.180-182, 1992. ,
Time-Domain Finite-Difference and Finite-Element Methods for Maxwell Equations in Complex Media, IEEE Transactions on Antennas and Propagation, vol.56, pp.2150-2166, 2008. ,
Picosecond imaging circuit analysis, Picosecond imaging circuit analysiss, pp.583-603, 2000. ,
DOI : 10.1147/rd.444.0583
A case study for optics : The solid immersion microscope, American J. Phys, pp.76-758, 2008. ,
Two-photon volumetric optical disk storage systems experimental results and potentialss, Optics in Computing Minimum size and maximum packaging density of non-redundant semiconductor devicess, Proc. )RE, pp.286-298, 2003. ,
Calculation of Nonlinear Optical Susceptibilities Using Diagrammatic Perturbation Theory, Reviews of Modern Physics, vol.37, issue.1, pp.1-18 ,
DOI : 10.1103/RevModPhys.37.1
Theory and Practice of Scanning Optical Microscopy, 1984. ,
Theory of optical beam induced current images of defects in semiconductorss, J. App. Phys, pp.61-191, 1987. ,
Theory of optical beam induced current images of defects in semiconductorss, Journal of Applied Physics, vol.61, pp.191-195, 1987. ,
Two-photon optical beam induced current imaging through the backside of integrated circuitss, Appl .Phys. Lett, pp.71-2578, 1997. ,