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48 III.5 Configuration de départ pour réaliser une mesure, p.49 ,
54 III, 57 III.12Comparaison des FFT pour la puissance consommée et les émanations électromagnétiques, p.58 ,
79 IV.10 Répartition des slices à l'intérieur, 81 IV.13 Cartographie des slices X associés aux slices L pour le FPGA Spartan-6 numéro 2 83 IV.14 Cartographie des slices X associés aux slices M pour le FPGA Spartan-6 numéro, p.84 ,
91 IV.22 Représentation d'une unité de calcul réseau de l'architecture utilisée, 96 IV.24 Représentation d'une unité de calcul réseau de l'architecture utilisée incluant l'interface avec les oscillateurs en anneau . . . . . . . . . . . . . . . . . . . . . . . 97 ,
106 IV.29 Organisation de la séquence de vieillissement 1 107 IV.30 Cartographie de la carte montrant la dégradation de la carte au bout d'une semaine de vieillissement 108 IV.31 Cartographie de la carte montrant la dégradation de la carte au bout de deux semaines de vieillissement 109 IV.32 Cartographie de la carte montrant la dégradation de la carte lors de la deuxième semaine de vieillissement 109 IV.33 Cartographie de la carte montrant le regain de performance après une semaine sans activité, 110 IV.34 Cartographie de la carte montrant la dégradation totale de performances obtenue lors de l'expérience et après une semaine de régénération, p.111 ,
112 IV.36 Cartographie de la carte montrant la dégradation de la carte au bout d'une semaines de vieillissement, p.114 ,
96 IV.8 Valeurs mesurées en sortie d'un des 28 capteurs 100 IV.9 Variations de température et de tension mesurée pour chaque tâche pour un des 28 capteurs, 101 IV.10 Variations de température et de tension mesurée pour chaque tâche pour un des 28 capteurs, p.104 ,