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Etude du comportement au vieillissement des interfaces thermiques pour modules électroniques de puissance dédiés à des applications transports

Abstract : In the context of transportation applications, and especially the "more electric aircraft", with an ever present demand for space and weight reduction, the trend is to integrate more extensive of static converters. The increase in power density and the thermal stresses induced by the environment in which these structures are located, are becoming increasingly critical. Thermal management of these devices is provided by cooling systems on which are mounted the semiconductor components via a thermal interface material. Effective management will be achieved by reducing the overall thermal resistance between the dissipative elements and the environment by improving the cooling system and thermal properties of the materials constituting the module. However, this interface is a delicate point of heat transfer because it can represent several tens of percent of the circuit total thermal resistance. It therefore requires a thorough knowledge of their behavior in thermal stresses. After a state of the art on the thermal interface materials and methods for characterizing thermophysical properties of materials, we propose the implementation of experimental and mathematical tools to monitor any change of interface materials used in power electronics during aging by temperature cycling. For this, two methods are presented. The first is based on the measurement of the thermal resistance of the interfaces with a steady one-dimensional heat transfer, while the second, based on a characterization of a transient thermal system, allows to identify the time constants and the resistor and capacitor network of the tested system. Numerical simulations were carried out on two types of experimental benches, on one side in order to assess the lateral heat losses from static bench, on the other side to show that it is possible to detect a change in the thermal resistance of a TIM with the analysis of the thermal impedance.
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Submitted on : Thursday, November 28, 2013 - 3:02:11 PM
Last modification on : Wednesday, December 30, 2020 - 1:08:04 PM
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  • HAL Id : tel-00910948, version 1


Jean-Pierre Ousten. Etude du comportement au vieillissement des interfaces thermiques pour modules électroniques de puissance dédiés à des applications transports. Autre. École normale supérieure de Cachan - ENS Cachan, 2013. Français. ⟨NNT : 2013DENS0020⟩. ⟨tel-00910948⟩



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