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Une approche globale pour la métrologie 3D automatique multi-systèmes

Abstract : 3D metrology allows GD\&{}T verification on mechanical parts. This verification is usually calculated using data obtained with a touch probe mounted on a coordinate measuring machine. Such a measurement offers a high data quality but requires an expensive processing time. The proposed research aims at expanding optical measurements in 3D metrology, reducing execution time but with a lower data quality. The lack of standard in this field makes the use of optical sensors uncommon in 3D metrology. Indeed, the system selection is mostly carried out from its quality specifications. Therefore we propose a protocol to assess the quality of optical measuring systems that allows in particular quantification of acquired data quality. The results of measuring system qualification are stored in a database. Taking advantages of this database, a global multi-system 3D inspection process is set up allowing the selection of the best digitizing system (contact or contactless) in terms of quality and digitizing cost. When using optical sensors, the poor quality is mostly due to digitizing noise inherent to this kind of systems. A filter that removes noise, keeping the form deviation of the surface, is proposed in the process to make possible the specification verification for applications with small tolerance intervals using optical systems.
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Submitted on : Thursday, November 21, 2013 - 9:17:31 AM
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  • HAL Id : tel-00907272, version 1



Nicolas Audfray. Une approche globale pour la métrologie 3D automatique multi-systèmes. Autre. École normale supérieure de Cachan - ENS Cachan, 2012. Français. ⟨NNT : 2012DENS0084⟩. ⟨tel-00907272⟩



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