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Applications de la cartographie en émission de lumière dynamique (Time Resolved Imaging) pour l’analyse de défaillance des composants VLSI

Abstract : VLSI ("Very Large Scale Integration") technologies are part of our daily lives and our miniaturization needs are increasing. The densification of transistors not only means trouble locating the so-called "hard defects" occurring during the development phases (debug) or aging, but also the appearance of pure non-functional behaviors related to component design flaws. Techniques discussed in this document are intended to probe the microelectronic circuits using a tool called dynamic light emission (Time Resolved Imaging - TRI) in search of abnormal behavior in terms of timings and patterns involved in structures. To go further, this instrument also allows viewing thermographic time resolved thermal transients within a component.
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https://tel.archives-ouvertes.fr/tel-00881156
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Submitted on : Thursday, November 7, 2013 - 4:12:10 PM
Last modification on : Thursday, February 3, 2022 - 3:58:24 PM
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  • HAL Id : tel-00881156, version 1

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Guillaume Bascoul. Applications de la cartographie en émission de lumière dynamique (Time Resolved Imaging) pour l’analyse de défaillance des composants VLSI. Autre. Université Sciences et Technologies - Bordeaux I, 2013. Français. ⟨NNT : 2013BOR14876⟩. ⟨tel-00881156⟩

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