. Du-banc-d-'´-echantillonnagé-electro-optique, Une amélioration plus significative serait l'utilisation d'un polymèré electro-optique comme milieu de détection. Ce banc de mesure d'´ echantillonnagé electro-optique est prêt pour la mesure de la forme d

]. K. Bibliographie, H. Bock, H. Schafer, D. Knapp, K. Zoschg et al., Métrologie de la forme d'onde, International Electron Devices Meeting (IEDM). Technical Digest, 2009.

T. Hirose, Y. Momiyama, M. Kosugi, H. Kano, and Y. Watanabe, A 185 GHz f/sub max/ SOI DTMOS with a new metallic overlay-gate for low-power RF applications, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224), 2001.
DOI : 10.1109/IEDM.2001.979672

C. C. Wang, M. Currie, and R. Sobolewski, Subpicosecond electrical pulse generation by edge illumination of silicon and indium phosphide photoconductive switches, Applied Physics Letters, vol.67, issue.1, pp.79-81, 1995.
DOI : 10.1063/1.115513

J. S. Rieh, B. Jagannathan, H. Chen, K. T. Schonenberg, and D. Angell, SiGe HBTs with cut-off frequency of 350 GHz, Digest. International Electron Devices Meeting,, 2002.
DOI : 10.1109/IEDM.2002.1175952

Y. Bin, W. Haihong, A. Joshi, X. Qi, I. Effion et al., 15 nm gate length planar CMOS transistor, International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224), p.15
DOI : 10.1109/IEDM.2001.979669

M. Y. Frankel, S. Gupta, J. A. Valdmanis, and G. A. Mourou, Generation of optical pulses shorter than 0.1 ps by colliding pulse modelocking, Appl. Phys. Lett, vol.38, pp.617-619, 1981.

H. M. Heiliger, M. Nagel, H. G. Roskos, H. Kurz, F. Schnieder et al., Lowdispersion thin-film microstrip lines with cyclotene as dielectric medium

D. Williams, P. Hale, and K. A. Remley, The Sampling Oscilloscope as a Microwave Instrument, IEEE Microwave Magazine, vol.8, issue.4, p.59, 2007.
DOI : 10.1109/MMW.2007.383954

K. Rush, S. Draving, and J. Kerley, Characterizing high-speed oscilloscopes, IEEE Spectrum, vol.27, issue.9, 1990.
DOI : 10.1109/6.58452

. Keenan, Calibration of sampling oscilloscopes with high-speed photodiodes, IEEE Trans. Microwave Theory Tech, pp.3173-3181, 2006.

M. Bieler, S. Seitz, M. Spitzer, G. Hein, and K. Pierz, Rise-Time Calibration of 50-GHz Sampling Oscilloscopes: Intercomparison Between PTB and NPL, IEEE Transactions on Instrumentation and Measurement, vol.56, issue.2, 2007.
DOI : 10.1109/TIM.2007.890609

D. F. Williams, A. Lewandowski, T. S. Clement, C. M. Wang, P. D. Hale et al., Covariance-based uncertainty analysis of the NIST electrooptic sampling system, IEEE Transactions on Microwave Theory and Techniques, vol.54, issue.1, pp.481-491, 2006.
DOI : 10.1109/TMTT.2005.860492

B. Jonathan and . Scott, Rapid Millimetre-wave Sampler Response Characterization to Well Beyond 120 GHz Using an Improved Nose-to-nose Method, IEEE MTT-S Digest, p.1511, 2003.

D. F. Williams, K. A. Remley, and D. C. Degroot, Nose-to-Nose Response of a 20-GHz Sampling Circuit, 54th ARFTG Conference Digest
DOI : 10.1109/ARFTG.1999.327365

K. A. Remley, D. F. Williams, and C. Donald, DeGroot, Effects of Nonlinear Diode Junction Capacitance on the Nose-to-Nose Calibration, IEEE Microwave and wireless components letters, vol.11, issue.5, 2001.

P. D. Hale, T. S. Clement, K. J. Coakley, C. M. Wang, D. C. Degroot et al., Estimating the Magnitude and Phase Response of a 50 GHz Sampling Oscilloscope Using the "Nose-to-Nose" Method, 55th ARFTG Conference Digest
DOI : 10.1109/ARFTG.2000.327397

J. Verspecht and K. , Rush Individual Characterization of Broadband Sampling Oscilloscopes with a Nose-to-Nose Calibration Procedure, IEEE Transactions on instrumentation and measurement, vol.43, issue.2, 1994.

A. Kate, Remley Nose-to-Nose Oscilloscope Calibration Phase Error Inherent in the Sampling Circuitry, 60th ARFTG Conf, pp.85-97, 2002.

D. F. Williams, T. S. Clement, and K. A. Remley, Systematic Error of the Nose-to-Nose Sampling-Oscilloscope Calibration, IEEE Transactions on Microwave Theory and Techniques, vol.55, issue.9, 2007.
DOI : 10.1109/TMTT.2007.904333

N. G. Paulter and D. R. Larson, Sources of uncertainty in the nose-to-nose sampler calibration method, IEEE Transactions on Instrumentation and Measurement, vol.52, issue.5, 2003.
DOI : 10.1109/TIM.2003.817902

A. Kate, D. F. Remley, and . Williams, Sampling Oscilloscope Models and Calibrations, IEEE MTT-S Digest, 2003.

S. Badi, Interfaces optoélectroniques ultra-rapides pour l'´ electronique supraconductricè a quantum de flux magnétique, 2008.

Y. R. Shen, The principles of nonlinear optics, 1984.

A. Carenco, Composants actifs, Ecole d'Eté systèmes Optiques, 1984.

H. Brian, D. M. Kolner, and . Bloom, Electrooptic Sampling in GaAs Integrated Circuits, IEEE Journal of quantum electronics, vol.22, issue.1, 1986.

J. P. Huignard, Présentation de l'effetélectroeffetélectro-optique, Ecole d'Eté d'Optoélectronique, p.294

R. Doerner and A. Rumiantsev, Verification of the wafer-Level LRM + calibration technique for GaAs applications up to 110 GHz, ARFG Microwave Measurements Conference-Spring, 2005.

D. Frickey, S. Conversions-between, Z. , Y. , H. et al., Conversions between S, Z, Y, H, ABCD, and T parameters which are valid for complex source and load impedances, IEEE Transactions on Microwave Theory and Techniques, vol.42, issue.2, pp.205-211, 1994.
DOI : 10.1109/22.275248

L. Joulaud, Echantillonnage electro-optique a 1,55 m pour la mesure de circuits rapide sur InP, 2004.

D. H. Auston, Picosecond optoelectronic switching and gating in silicon, Applied Physics Letters, vol.26, issue.3, p.101, 1975.
DOI : 10.1063/1.88079

A. M. Johnson and D. H. Auston, Microwave switching by picosecond photoconductivity, IEEE Journal of Quantum Electronics, vol.11, issue.6, p.283, 1975.
DOI : 10.1109/JQE.1975.1068622

H. N. Dib, K. P. , and L. C. , Study of a novel planar transmission line, 1991 IEEE MTT-S International Microwave Symposium Digest, pp.623-626, 1991.
DOI : 10.1109/MWSYM.1991.147080

L. P. Katehi and R. G. , Novel micromachined approaches to MMICs using low-parasitic, high-performance transmission media and environments, 1996 IEEE MTT-S International Microwave Symposium Digest, pp.1145-1148, 1996.
DOI : 10.1109/MWSYM.1996.511232

C. P. Wen and C. Waveguide, A Surface Strip Transmission line suitable for Nonreciprocal Gyromagnetic Device Applications, IEEE Trans. Microwave Theory Tech, vol.17, issue.12, 1087.

C. Veyres and H. V. , Extension of the application of conformal mapping techniques to coplanar lines with finite dimensions, International Journal of Electronics, vol.17, issue.1, pp.47-56, 1980.
DOI : 10.1080/00207218008901066

D. R. Grischkowsky, M. B. Ketchen, and C. C. Chi, Capacitance free generation and detection of subpicosecond electrical pulses on coplanar transmission lines, IEEE Journal of Quantum Electronics, vol.24, issue.2, p.221, 1988.
DOI : 10.1109/3.116

J. A. Valdmanis and G. Mourou, Subpicosecond electrooptic sampling: Principles and applications, IEEE Journal of Quantum Electronics, vol.22, issue.1, p.69, 1986.
DOI : 10.1109/JQE.1986.1072867

U. D. Keil and D. R. Dykaar, Electro???optic sampling and carrier dynamics at zero propagation distance, Applied Physics Letters, vol.61, issue.13, pp.1504-1506, 1992.
DOI : 10.1063/1.107530

E. Sano and T. Shibata, Mechanism of subpicosecond electrical pulse generation by asymmetric excitation, Applied Physics Letters, vol.55, issue.26, pp.2748-2750, 1989.
DOI : 10.1063/1.101942

M. C. Nuss, D. W. Kisker, P. R. Smith, and T. E. Harvey, Efficient generation of 480 fs electrical pulses on transmission lines by photoconductive switching in metalorganic chemical vapor deposited CdTe, Applied Physics Letters, vol.54, issue.1, pp.57-59, 1989.
DOI : 10.1063/1.100834

D. R. Hjelme, M. J. Yadlowsky, and A. R. Mickelson, Two-dimensional mapping of the microwave potential on MMIC's using electrooptic sampling, IEEE Trans

W. Mertin, Two-dimensional field mapping of monolithic microwave integrated circuits using electrooptic sampling techniques, Optical and Quantum Electronics, vol.24, issue.7, pp.801-817, 1996.
DOI : 10.1007/BF00820150

K. Yang, G. David, and J. G. Yook, Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna, IEEE Transactions on Microwave Theory and Techniques, vol.48, issue.2, pp.288-294, 2000.
DOI : 10.1109/22.821779

W. R. Donaldson, L. Kingsley, and W. Weiner, Electro???optic imaging of the internal fields in a GaAs photoconductive switch, Journal of Applied Physics, vol.68, issue.12, pp.6453-6457, 1990.
DOI : 10.1063/1.346843

R. A. Falk, J. C. Adams, and C. D. Capps, Electro-optic imagery of high-voltage GaAs photoconductive switches, IEEE Transactions on Electron Devices, vol.42, issue.1, pp.43-49, 1995.
DOI : 10.1109/16.370037

J. C. Adams, R. A. Falk, S. G. Ferrier, and C. D. Capps, Electro-optic imaging of internal fields in (111) GaAs photoconductors, IEEE Transactions on Electron Devices, vol.42, issue.6, pp.1081-1085, 1995.
DOI : 10.1109/16.387240

Q. Wu, T. D. Hewitt, and X. C. Zhang, Two???dimensional electro???optic imaging of THz beams, Applied Physics Letters, vol.69, issue.8, pp.1026-1028, 1996.
DOI : 10.1063/1.116920

A. Yariv, Optical Electronics in Modern Communications, 1997.

G. Hasnain, A. Dienes, and J. Whinnery, Dispersion of Picosecond Pulses in Coplanar Transmission Lines, IEEE Transactions on Microwave Theory and Techniques, vol.34, issue.6, pp.738-741, 1986.
DOI : 10.1109/TMTT.1986.1133427

M. Y. Frankel, S. Gupta, J. A. Valdmanis, and G. A. Mourou, Terahertz attenuation and dispersion characteristics of coplanar transmission lines, IEEE Transactions on Microwave Theory and Techniques, vol.39, issue.6
DOI : 10.1109/22.81658

C. L. Liao, Y. M. Tu, J. Y. Ke, and C. H. Chen, Transient propagation in lossy coplanar waveguides, IEEE Transactions on Microwave Theory and Techniques, vol.44, issue.12, pp.2605-2611, 1996.
DOI : 10.1109/22.554610

J. Y. Ke and C. H. Chen, Dispersion and attenuation characteristics of coplanar waveguides with finite metallization thickness and conductivity, IEEE Trans

U. D. Keil, D. R. Dykaar, A. F. Levi, and R. F. Kopf, High-speed coplanar transmission lines, IEEE Journal of Quantum Electronics, vol.28, issue.10, pp.2333-2342, 1992.
DOI : 10.1109/3.159540

M. Bieler, Ultrafast Optoelectronic Switches : Physics of Pulse Generation and Applications to High-Frequency Device Characterization, 2003.

M. Bieler, M. Spitzer, G. Hein, and U. Siegner, Time-domain characterisation of non-coplanar high-frequency components up to 300???GHz, Electronics Letters, vol.38, issue.18, pp.1038-1039, 2002.
DOI : 10.1049/el:20020655

D. Henderson, A. G. Roddie, and A. J. Smith, Recent developments in the calibration of fast sampling oscilloscopes, IEE Proceedings A Science, Measurement and Technology, vol.139, issue.5, pp.254-260, 1992.
DOI : 10.1049/ip-a-3.1992.0044

A. J. Smith, A. G. Roddie, and D. Henderson, Electrooptic sampling of low temperature GaAs pulse generators for oscilloscope calibration, Optical and Quantum Electronics, vol.32, issue.7, pp.933-943, 1996.
DOI : 10.1007/BF00820158

J. Lecourt, Etude et réalisation de laseràlaserà fibre auto-impulsionnels ` a base d'absorbants saturables, thèse pour obtenir le grade de docteur de l

D. Ludovic, CaractérisationCaractérisationélectro-optique de composants térahertz paréchantillonnageparéchantillonnage Franz-Keldysh subpicoseconde, Thèse de doctorat, 2003.

S. Rehnmark, On the Calibration Process of Automatic Network Analyzer Systems , Microwave Theory and Techniques, IEEE Transactions on, vol.22, issue.4, pp.457-458, 1974.

D. Rytting, Network Analyzer Error Models and Calibration Methods, ARFTG/NIST Short Course on RF Measurements for a Wireless World, 2001.

A. Packard, Specifying calibration Standards for the HP 8510

A. Scott and . Wattenberg, RF Measurements of Die and Packages, Artech House microwave library, 2002.

M. Imparato, T. Weller, and L. Dunleavy, On-wafer calibration using space-conservative (SOLT) standards, 1999 IEEE MTT-S International Microwave Symposium Digest (Cat. No.99CH36282), 1999.
DOI : 10.1109/MWSYM.1999.780285

C. G. Engen and . Hoer, Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network Analyzer, IEEE Transactions on Microwave Theory and Techniques, vol.27, issue.12, 1979.
DOI : 10.1109/TMTT.1979.1129778

C. D. Philip and . Hobbs, Building Electro-Optical Systems, Making it all work, Wiley series in pure and applied optics, pp.262-263, 2008.

L. Vegard and . Tuft, Polarization and Polarization Controllers, 2007.

B. Mebrouk, Etude et traçabilité du calibrage ? Line- Attenuator-Reflect ? pour des mesures sous pointesàpointesà l'aide d'un Analyseur de Réseau Vectoriel, Thèse de doctorat, Ecole Nationale Superieure des Télécommunications, 2010.

D. F. Williams, C. M. Wang, and U. Arz, An Optimal Multiline TRL Calibration Algorithm, National Institute of Standards and Technology

D. H. Auston, Picosecond optoelectronic switching and gating in silicon, Applied Physics Letters, vol.26, issue.3, pp.101-103, 1974.
DOI : 10.1063/1.88079

B. H. Kolner and D. M. Bloom, Electro-optic Sampling in GaAs Integrated Circuits, IEEE JOURNAL OF QUANTUM ELECTRO- NICS, vol.22, issue.1, 1986.

B. H. Kolner, D. M. Bloom, and P. S. Cross, Electro-optic sampling with picosecond resolution, Electrooptic Sampling with picosecond resolution, pp.574-575, 1983.
DOI : 10.1049/el:19830391

J. A. Valdmanis, G. Mourou, and C. W. Gabel, Picosecond electro???optic sampling system, Picosecond electro-optic sampling system, pp.211-212, 1982.
DOI : 10.1063/1.93485

Q. Wu and X. C. Zhang, Ultrafast electro???optic field sensors, Applied Physics Letters, vol.68, issue.12, 1996.
DOI : 10.1063/1.115665

G. F. Engen and C. Hoer, A, Thru-Reflect-Line an improved technique for calibrating the dual six -port automatic network analyser, IEEE Transactions Microwave Theory and Techniques, issue.12, p.27, 1979.

M. Bieler, S. Seitz, M. Spitzer, G. Hein, K. Pierz et al., Rise- Time Calibration of 50 GHz Sampling Osicilloscopes : Intercomparison Between PTB and NPL, IEEE Transctions on instrumentation and measurement, vol.56, issue.2, 2007.

M. Bieler, M. Spitzer, G. Hein, K. Pierz, and U. Siegner, Calibration of the step response of a 70 GHz sampling oscilloscope using a novel optoelectronic technique, 2008 Conference on Precision Electromagnetic Measurements Digest, 2008.
DOI : 10.1109/CPEM.2008.4574961

S. Seitz, M. Bieler, M. Spitzer, K. Pierz, G. Hein et al., Optoelectronic measurement of the transfer function and time response of a 70 GHz sampling oscilloscope, Measurement Science and Technology, vol.16, issue.10, 2005.
DOI : 10.1088/0957-0233/16/10/L02

R. A. Dudley, A. G. Roddie, D. J. Bannister, A. D. Giford, and T. , Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits, IEE Proceedings - Science, Measurement and Technology, vol.146, issue.3, pp.117-122, 1999.
DOI : 10.1049/ip-smt:19990171

M. Y. Frankel, J. F. Whitaker, G. A. Mourou, and J. A. Valdmanis, Ultrahighbandwidth vector network analyzer based on external electro-optic sampling, Solid-state electronics, pp.3-325, 1992.