W. Journaux, R. Mansour, H. Ayoubi, R. Ziade, W. Velazco et al., An Optimal Implementation on FPGA of a Hopfield Neural Network Advances in Artificial Neural Systems, Article 189368, 9 pages, 2011.

F. Mansour, F. Pancher, and . Bezerra, Improving SEU Fault Tolerance Capabilities of a Self-Converging Algorithm, In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations, IEEE Transactions on Nuclear Science IEEE Transactions on Nuclear Science, vol.58, issue.59, pp.818-823, 2011.
URL : https://hal.archives-ouvertes.fr/hal-00674545

W. Mansour, R. Velazco, and . Fault, Injection in VHDL-Based Processors: A Case Study, candidated for publication in JETTA special issue, Journal of Electronic Testing: Theory and Applications), 2012.

W. R. Conférences, G. Velazco, F. Foucard, W. Pancher, G. Mansour et al., Robustness with respect to SEUs of a self-converging algorithm, th Latin-American Test Workshop (LATW'11), pp.27-30, 2011.

W. Mansour and R. Velazco, An Automated SEU Fault-Injection Method and Tool for HDL-Based Designs, IEEE Transactions on Nuclear Science, vol.60, issue.4, pp.24-28, 2012.
DOI : 10.1109/TNS.2013.2267097
URL : https://hal.archives-ouvertes.fr/hal-01136117

V. Pancher, F. Lacoste, W. Palumbo, L. Mansour, F. Artola et al., Continuous highaltitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based-on MUSCA SEP 3, IEEE proceedings of RADECS, vol.2012, pp.24-28
URL : https://hal.archives-ouvertes.fr/hal-00747172

W. Mansour, R. Ayoubi, H. Ziade, W. Falou, and R. Velazco, A Fault-Tolerant Implementation on FPGA of a Hopfield Neural Network, accepted for presentation at DCIS (Design of Integrated Circuits and Systems), pp.28-30

W. Mansour, W. Falou, H. Ziade, R. Ayoubi, and R. Velazco, SEU simulation by fault injection in PSoC device: Preliminary results, 2012 2nd International Conference on Advances in Computational Tools for Engineering Applications (ACTEA)
DOI : 10.1109/ICTEA.2012.6462894

M. A. Aguirre, FT-UNSHADES: A new for SEU injection, analysis and diagnostics over post synthesis netlist, proceedings NASA Military and Aerospace Programmable Logic Devices, 2005.

]. M. Aguirre, Selective Protection Analysis Using a SEU Emulator: Testing Protocol and Case Study Over the Leon2 Processor, IEEE Transactions on Nuclear Science, vol.54, issue.4, pp.951-956, 2007.
DOI : 10.1109/TNS.2007.895550

]. L. Antoni, Using run-time reconfiguration for fault injection applications, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, pp.1773-1777, 2001.
URL : https://hal.archives-ouvertes.fr/hal-00015055

J. Arlat, Fault injection for dependability validation: a methodology and some applications, IEEE Transactions on Software Engineering, vol.16, issue.2, pp.166-182, 1990.
DOI : 10.1109/32.44380

]. L. Artola, SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node, IEEE Transactions on Nuclear Science, vol.58, issue.3, 2011.
DOI : 10.1109/TNS.2011.2144622
URL : https://hal.archives-ouvertes.fr/ujm-01011671

]. R. Ayoubi, An efficient implementation of multilayer perceptron on mesh architecture, Proceedings of the IEEE International Symposium on Circuits and Systems (ISCAS '02), pp.109-112, 2002.

]. R. Ayoub, Hopfield associative memory on mesh, 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512), pp.800-803, 2004.
DOI : 10.1109/ISCAS.2004.1329929

]. J. Baraza, Improvement of fault injection techniques based on VHDL code modification, Tenth IEEE International High-Level Design Validation and Test Workshop, 2005., pp.19-26, 2005.
DOI : 10.1109/HLDVT.2005.1568808

]. R. Baumann, Boron compounds as a dominant source of alpha particles in semiconductor devices, IEEE Int. Reliability Physics Symposium, pp.297-302, 1995.

]. D. Binder, Satellite Anomalies from Galactic Cosmic Rays, IEEE Transactions on Nuclear Science, vol.22, issue.6, p.2675, 1975.
DOI : 10.1109/TNS.1975.4328188

J. Bou, MEFISTO-L: a VHDL-based fault injection tool for the experimental assessment of fault tolerance, Digest of Papers. Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing (Cat. No.98CB36224), pp.168-173, 1998.
DOI : 10.1109/FTCS.1998.689467

]. J. Boudenot, L'Environnement Spatial'' Collection ''Que sais-je ?, 1995.

E. J. Boudenot and . Boudenot, Tenue des circuits aux radiations ionisantes, volume E 3 950

]. J. Bourrieau, L'Environnement Spatial (flux, dose, blindage, effets des ions lourds) Septembre, 1991.

]. P. Brenni, Le générateur de Van de Graaf, Une machine électrostatique pour le XXème siècle, Bulletin of the Scientifique Instrument Society, issue.63, 1999.

]. K. O-'brien, The Natural Radiation Environment, p.15, 1971.

]. S. Buchner, Laser Simulation of Single Event Upsets, IEEE Transactions on Nuclear Science, vol.34, issue.6, p.1228, 1987.
DOI : 10.1109/TNS.1987.4337457

]. S. Chau, L. Alkalai, and A. T. Tai, Analysis of a multi-layer fault-tolerant COTS architecture for deep space missions, Proceedings 3rd IEEE Symposium on Application-Specific Systems and Software Engineering Technology, 2000.
DOI : 10.1109/ASSET.2000.888035

]. A. Chee, Potential Doses to Passengers and Crew of Supersonic Transports, Health Physics, vol.79, issue.5, p.547, 2000.
DOI : 10.1097/00004032-200011000-00011

]. P. Cheynet, Etude de la robustesse du contrôle intelligent face aux fautes induites par les radiations, 1999.

]. P. Civera, Exploiting FPGA-based techniques for fault injection campaigns on VLSI circuits, Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.250-258, 2001.
DOI : 10.1109/DFTVS.2001.966777

]. H. De-la-rochette, « Latchup déclenché par ion lourd dans des structures CMOS-1 ?m : approche expérimentale, simulation 2D et 3D, Thèse, 1995.

]. T. Delong, A fault injection technique for VHDL behaviorallevel models, Proc. of the IEEE Design and Test of Computers, pp.24-33, 1996.

]. E. Dijikstra, Self stabilizing systems in spite of distributed control, Communications of the Association of the Computing Machinery, pp.643-644, 1974.

]. J. Diubaldo, NASA Earth Observing System Mission Operations Center development using COTS products, 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484), 2000.
DOI : 10.1109/AERO.2000.878230

S. Doley, A. Israeli, and S. Moran, Analyzing Expected Time by Scheduler-Luck Games, IEEE Trans. Soft. Eng, vol.21, issue.5, pp.429-439, 1995.

]. S. Duzellier, EXEQ II and III: On-board experiments for the study of single events, RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294), pp.504-509, 1997.
DOI : 10.1109/RADECS.1997.698985

]. S. Duzellier, Space Radiation Environment and its Effects on Spacecraft Components and Systems, chapter Single Event Effects: analysis and testing, pp.221-242, 2004.

]. S. Duzellier, Space Radiation Environment and its Effects on Spacecraft Components and Systems, chapter Single Event Effects: analysis and testing, pp.221-242, 2004.

J. A. Eddy, The Sun, The Earth and Near-Earth Space, National Aeronautics and Space Administration (NASA), NASA Publication #NP- 2009-1-066-GSFC [Entrena 2012] L. Entrena et al., Soft Error Sensitivity Evaluation of Microprocessors by Multilevel Emulation-Based Fault Injection, Trans. On Computers, pp.313-322, 2012.

]. F. Faure, Thesic+: A flexible system for see testing, In proc. Of RADECS, 2002.

]. R. Fleischer, Nuclear tracks in solids, principles & applications, 1975.

]. P. Folkesson, A comparison of simulation based and scan chain implemented fault injection, Digest of Papers. Twenty-Eighth Annual International Symposium on Fault-Tolerant Computing (Cat. No.98CB36224), pp.284-293, 1998.
DOI : 10.1109/FTCS.1998.689479

]. G. Foucard, Taux d'erreurs dues aux radiations pour des applications implémentées dans des FPGAs a base de mémoire SRAM: prédiction versus mesures, 2008.

]. C. Guenzer, Single event upset of dynamic ram's by neutrons and protons, IEEE Transactions on Nuclear Sciences, vol.26, 1979.

]. M. Guthaus, MiBench: A free, commercially representative embedded benchmark suite, Proceedings of the Fourth Annual IEEE International Workshop on Workload Characterization. WWC-4 (Cat. No.01EX538), pp.3-14, 0200.
DOI : 10.1109/WWC.2001.990739

]. J. Hopfield, Neurons with graded response have collective computational properties like those of two-state neurons., Proceedings of the National Academy of Sciences, vol.81, issue.10, 1982.
DOI : 10.1073/pnas.81.10.3088

C. Tetz and . Huang, A self-stabilizing algorithm for the shortest path problem assuming read/write atomicity, Journal of Computer and System Sciences, vol.71, issue.1, pp.70-85, 2005.

]. G. Hubert, Operational SER Calculations on the SAC-C Orbit Using the Multi-Scales Single Event Phenomena Predictive Platform (MUSCA <formula formulatype="inline"><tex Notation="TeX">${\rm SEP}^{3}$</tex></formula>), IEEE Transactions on Nuclear Science, vol.56, issue.6, pp.3032-3042, 2009.
DOI : 10.1109/TNS.2009.2034148

]. G. Hubert, Impact of the Solar Flares on the SER Dynamics on Micro and Nanometric Technologies, IEEE Transactions on Nuclear Science, vol.57, issue.6, pp.3127-3134, 2010.
DOI : 10.1109/TNS.2010.2077649

]. M. Jeitler, FuSE - a hardware accelerated HDL fault injection tool, 2009 5th Southern Conference on Programmable Logic (SPL), pp.84-94, 2009.
DOI : 10.1109/SPL.2009.4914906

]. E. Jenn, Fault injection into VHDL models: the MEFISTO tool, Proceedings of IEEE 24th International Symposium on Fault- Tolerant Computing, pp.336-344, 1994.
DOI : 10.1109/FTCS.1994.315656

]. D. Kilpatric, Unsupervised classification of Antarctic Satellite Imagery using kohonen's self-organizing feature map, Proceedings of IEEE International Conference on Neural Networks, pp.32-36, 1995.

]. E. Kwiatkowska, Hybrid neural network system for cloud classification from satellite images, Proceedings of ICNN'95, International Conference on Neural Networks, pp.1907-1912, 1995.
DOI : 10.1109/ICNN.1995.488961

]. B. Leiner, Hardware Architecture for FPGA Implementation of a Neural Network and Its Application in Images Processing, 2008 Electronics, Robotics and Automotive Mechanics Conference, pp.405-410, 2008.
DOI : 10.1109/CERMA.2008.32

]. A. Lesea, The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs, IEEE Transactions on Device and Materials Reliability, vol.5, issue.3, 2005.
DOI : 10.1109/TDMR.2005.854207

]. W. Leung, The ideal SoC memory: 1T-SRAM, Proceedings of the 13th Annual IEEE International ASIC/SOC Conference, pp.32-36, 2000.

. Lopez-ongil, A Unified Environment for Fault Injection at Any Design Level Based on Emulation, IEEE Transactions on Nuclear Science, vol.54, issue.4, pp.946-950, 2007.
DOI : 10.1109/TNS.2007.904078

]. T. May, Alpha-particle-induced soft errors in dynamic memories, IEEE Transactions on Electron Devices, vol.26, issue.1, 1979.
DOI : 10.1109/T-ED.1979.19370

]. H. Madeira, RIFLE: A general purpose pin-level fault injector, Proc of the European Dependable Computing Conference, pp.199-216, 1979.
DOI : 10.1007/3-540-58426-9_132

]. X. Miniere, A neural network approach to the classification of electron and proton whistlers, Journal of Atmospheric and Terrestrial Physics, vol.58, issue.7, pp.911-924, 1996.
DOI : 10.1016/0021-9169(95)00077-1

]. H. Guzman-miranda, FT-UNSHADES-uP: A platform for the analysis and optimal hardening of embedded systems in radiation environments, 2008 IEEE International Symposium on Industrial Electronics, pp.2276-2281, 2007.
DOI : 10.1109/ISIE.2008.4677166

]. A. Mohammadi, SCFIT: A FPGA-based fault injection technique for SEU fault model, 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE), pp.586-589, 2012.
DOI : 10.1109/DATE.2012.6176538

]. L. Naviner, FIFA: A fault-injection???fault-analysis-based tool for reliability assessment at RTL level, Microelectronics Reliability, vol.51, issue.9-11, pp.1459-1463, 2011.
DOI : 10.1016/j.microrel.2011.06.017
URL : https://hal.archives-ouvertes.fr/hal-00627134

]. E. Normand, Single-event effects in avionics, IEEE Transactions on Nuclear Science, vol.43, issue.2, pp.461-474, 1996.
DOI : 10.1109/23.490893

]. T. Oldham and F. B. Mclean, Total ionizing dose effects in MOS oxides and devices, IEEE Transactions on Nuclear Science, vol.50, issue.3, pp.483-499, 2003.
DOI : 10.1109/TNS.2003.812927

J. Olsen, Neutron-induced single event upsets in static RAMS observed a 10 km flight attitude, IEEE Transactions on Nuclear Science, vol.40, issue.2, pp.74-77, 1993.
DOI : 10.1109/23.212319

]. P. Peronnard, Predicting the SEU error rate through fault injection for a complex microprocessor, 2008 IEEE International Symposium on Industrial Electronics, 2008.
DOI : 10.1109/ISIE.2008.4677290
URL : https://hal.archives-ouvertes.fr/hal-00378170

]. P. Peronnard, Méthodes et outils pour l'évaluation de la sensibilité de circuits intégrés avancés face aux radiations naturelles, 2009.

]. P. Peronnard, Real-life SEU experiments on 90 nm SRAMS in atmospheric environment: measures versus predictions done by means of MUSCA SEP3 platform, IEEE Transactions on Nuclear Science, vol.6, issue.6, pp.3450-3455, 2009.
URL : https://hal.archives-ouvertes.fr/hal-00482449

]. V. Pouget, Theoretical Investigation of an Equivalent Laser LET, Microelectronics Reliability, vol.41, issue.9-10, pp.1513-1518, 2001.
DOI : 10.1016/S0026-2714(01)00156-1
URL : https://hal.archives-ouvertes.fr/hal-00185402

]. B. Rahbaran, Built-in Fault Injection in Hardware - The FIDYCO Example, Second IEEE International Workshop on Electronic Design, Test and Applications, pp.327-332, 2004.
DOI : 10.1109/DELTA.2004.10070

]. S. Rezgui, Prédiction du taux d'erreurs d'architectures digitales: une méthode et des résultats expérimentaux, 2001.

]. A. Richter, Simulation of Heavy Charged Particle Tracks Using Focused Laser Beams, IEEE Transactions on Nuclear Science, vol.34, issue.6, p.1234, 1987.
DOI : 10.1109/TNS.1987.4337458

]. J. Ritter, Microelectronis and Photonics Test Bed, 20th Annual ASS Guidance and Control Conference, 1997.

C. Rousselle, A register-transfer-level fault simulator for permanent and transient faults in embedded processors, Proceedings Design, Automation and Test in Europe. Conference and Exhibition 2001, 2001.
DOI : 10.1109/DATE.2001.915148

]. S. Saif, An FPGA Implementation of a Hopfield Optimized Block Truncation Coding, 2006 6th International Workshop on System on Chip for Real Time Applications, pp.169-172, 2006.
DOI : 10.1109/IWSOC.2006.348230

]. S. Saif, An FPGA implementation of a neural optimization of block truncation coding for image/video compression, Microprocessors and Microsystems, vol.31, issue.8, pp.477-486, 2007.
DOI : 10.1016/j.micpro.2006.02.004

]. M. Shokrallah-shirazi, FPGA-Based Fault Injection into Synthesizable Verilog HDL Models, 2008 Second International Conference on Secure System Integration and Reliability Improvement, 2008.
DOI : 10.1109/SSIRI.2008.47

]. V. Sieh, VERIFY: evaluation of reliability using VHDL-models with embedded fault descriptions, Proceedings of IEEE 27th International Symposium on Fault Tolerant Computing, pp.32-36, 1997.
DOI : 10.1109/FTCS.1997.614074

]. B. Sierawki, Impact of low-energy proton induced upset on test methods and rate predictions, IEEE Transactions on Nuclear Science, vol.46, issue.6, pp.3085-3092, 2009.

]. J. Sohn, The effects of single event upsets in avionics systems, 2000.

]. W. Stapor, Charge collection in silicon for ions of different energy but same linear energy transfer (LET), IEEE Transactions on Nuclear Science, vol.35, issue.6, p.1585, 1988.
DOI : 10.1109/23.25502

M. Stepanova, A Hopfield Neural Classifier and Its FPGA Implementation for Identification of Symmetrically Structured DNA Motifs, The Journal of VLSI Signal Processing Systems for Signal, Image, and Video Technology, vol.9, issue.10, pp.239-254, 2007.
DOI : 10.1007/s11265-007-0068-3

]. A. Taber, Investigation and characterization of SEU effects and hardening strategies in avionics'', IBM Rep, 1992.

]. A. Taber, Single event upset in avionics, IEEE Transactions on Nuclear Science, vol.40, issue.2, 1993.
DOI : 10.1109/23.212327

. Sci, Tang et al. Semm2: A modelling system for single event analysis, IEEE Transanctions on Nuclear Science, issue.26, pp.120-126, 2004.

]. R. Velazco, Thesic: A testbed suitable for the qualification of integrated circuits devoted to operate in harsh environment, IEEE European Test Workshop, pp.89-90, 1998.
URL : https://hal.archives-ouvertes.fr/hal-01384973

]. R. Velazco, Predicting error rate for microprocessor-based digital architectures through C.E.U. (Code Emulating Upsets) injection, IEEE Transactions on Nuclear Science, vol.47, issue.6, pp.2405-2411, 2000.
DOI : 10.1109/23.903784
URL : https://hal.archives-ouvertes.fr/hal-00008219

J. Waldemark, Hybrid neural network pattern recognition system for satellite measurements, Proceedings of ICNN'95, International Conference on Neural Networks, pp.195-199, 1995.
DOI : 10.1109/ICNN.1995.488092

]. H. Zarandi, Fault injection into verilog models for dependability evaluation of digital systems, Second International Symposium on Parallel and Distributed Computing, 2003. Proceedings., pp.281-287, 2003.
DOI : 10.1109/ISPDC.2003.1267675

H. R. Zarandi, Dependability analysis using a fault injection tool based on synthesizability of HDL models, Proceedings. 16th IEEE Symposium on Computer Arithmetic, pp.485-492, 2003.
DOI : 10.1109/DFTVS.2003.1250147

]. H. Zhang, FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation, 2008 IEEE International Symposium on Parallel and Distributed Processing with Applications, pp.525-531, 2008.
DOI : 10.1109/ISPA.2008.46

]. J. Ziegler, IBM experiments in soft fails in computer electronics (1978???1994), IBM Journal of Research and Development, vol.40, issue.1, pp.3-18, 1978.
DOI : 10.1147/rd.401.0003