Skip to Main content Skip to Navigation
Theses

Méthodes et outils pour l'analyse tôt dans le flot de conception de la sensibilité aux soft-erreurs des applications et des circuits intégrés

Abstract : Reducing the dimensions of transistors increases the soft-errors sensitivity of integrated circuits to energetic particles present in the environments in which they operate. An experiment, presented in this thesis, aiming to study soft-errors sensitivity, in real environment, of SRAM memories issued from two successive technologies, put in evidence the criticality of this thematic. This is to show the need to evaluate circuit's sensitivity to radiation effects, especially commercial circuits that are used more and more for space and avionic applications and even at high altitudes, in order to find the appropriate hardening methodologies. Several fault-injection methods, aiming at evaluating the sensitivity to soft-errors of integrated circuits, were goals for many researches. In this thesis was developed an automated method, and its corresponding tool, allowing the emulation of radiation effects on HDL-based circuits. This method, so-called NETFI (NETlist Fault-Injection), is based on modifying the netlist of the synthesized circuit to allow injecting faults of different types (SEU, SET and Stuck_at). NETFI was applied on different architectures in order to assess its efficiency and put in evidence its capabilities. A study on a fault-tolerant algorithm, so-called self-convergent, executed by a LEON3 processor, was also presented in order to perform an objective comparison between the results issued from NETFI and those issued from another state-of-the-art method, called CEU (Code Emulated Upset).
Document type :
Theses
Complete list of metadatas

Cited literature [92 references]  Display  Hide  Download

https://tel.archives-ouvertes.fr/tel-00838415
Contributor : Abes Star :  Contact
Submitted on : Monday, October 7, 2013 - 11:46:58 AM
Last modification on : Thursday, November 19, 2020 - 3:56:19 PM
Long-term archiving on: : Friday, April 7, 2017 - 7:50:32 AM

File

33069_MANSOUR_2012_archivage.p...
Version validated by the jury (STAR)

Identifiers

  • HAL Id : tel-00838415, version 2

Collections

STAR | CNRS | TIMA | UGA

Citation

Wassim Mansour. Méthodes et outils pour l'analyse tôt dans le flot de conception de la sensibilité aux soft-erreurs des applications et des circuits intégrés. Autre. Université de Grenoble, 2012. Français. ⟨NNT : 2012GRENT055⟩. ⟨tel-00838415v2⟩

Share

Metrics

Record views

767

Files downloads

491