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Development of methods for measuring optical nonlinearities of third order

Abstract : This study deals with the sensitivity of different experimental technique to characterize the third order optical susceptibility. We combine different well-known experimental techniques inside the 4f coherent imaging system in order to simplify the nonlinear optical characterization. We show that by changing the object at the entry and the field-stop at the output of the 4f setup it is possible to perform various popular nonlinear characterization methods, such as degenerate four-wave mixing (DFWM), Z-scan, EZ-scan, I-scan and nonlinear imaging technique with phase object (NIT-PO). We compare sensitivities corresponding to all these different methods. Furthermore we discuss the problem of photo-sensitivity of thin films in the context of determination of n2, the nonlinear refractive index and β, the nonlinear absorption coefficient. Moreover the well-known Z-scan method, typically exploited for nonlinear characterization, is employed to investigate permanent photo-induced changes in refraction and absorption as well as to characterize linear optical parameters of thin films, such as thickness and refractive index. We report also on Z-scan absolute measurements of n2 in carbon disulfide and fused silica. The results of nonlinear coefficients are obtained in picoseconds regime for three different wavelengths (355 nm, 532 nm and 1064 nm). Finally, linear and nonlinear optical characterization of new families of chalcogenide glasses (GeS2-Sb2S3-CsI) and oxide glasses with heavy metals (Pb(PO3)2-WO3) is presented.
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Submitted on : Tuesday, March 12, 2013 - 4:28:18 PM
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  • HAL Id : tel-00799815, version 1


Kamil Fedus. Development of methods for measuring optical nonlinearities of third order. Optics [physics.optics]. Université d'Angers, 2011. English. ⟨tel-00799815⟩



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