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Mesure de champs de températures vraies par thermoréflectométrie proche infrarouge

Abstract : True temperature field measurement is a key parameter for the optimization and the control of industrial processes. Current systems present limitations, especially on heterogeneous surfaces and/or in dynamical conditions involving the surface's variation. These restrictions are due to the ignorance of the surface's emissivity, which is a complex function of many physical quantities (temperature, wavelength, roughness, direction of detection). This thesis presents the complete development of a new method of true temperature field measurement, called Thermoreflectometry, applicable on any kind of opaque material, in the range [300-1000]°C. It allows the on-line measurement of emissivity by mixing a step of classical THERMOGRAPHY with a step of laser REFLECTOMETRY. The approach of this work is, first, the critical analysis of the method and its influence quantities, and then the optimal dimensionment of the components by simulation studies. Thirdly, a prototype is built and its defaults are characterized, following a CAMERA-based point of view, and the possible corrections are implemented. Finally, the experimental performances are estimated on some complex heterogeneous thermal scenes which emphasize the prototype's precision for all the tested samples.
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Contributor : Rémi Gilblas <>
Submitted on : Wednesday, March 6, 2013 - 1:46:07 PM
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  • HAL Id : tel-00797425, version 1

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Rémi Gilblas. Mesure de champs de températures vraies par thermoréflectométrie proche infrarouge. Optique / photonique. INSA de Toulouse, 2012. Français. ⟨tel-00797425⟩

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