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Theses

Analyse des modèles résines pour la correction des effets de proximité en lithographie optique

Abstract : The Progress made in microelectronics responds to the matter of production costs reduction and to the search of new markets. These progresses have been possible thanks those made in optical lithography, the printing process principally used in integrated circuit (IC) manufacturing.The miniaturization of integrated circuits has been possible only by pushing the limits of optical resolution. However this miniaturization increases the sensitivity of the transfer, leading to more proximity effects at progressively more advanced technology nodes (45 and 32 nm in transistor gate size). The correction of these optical proximity effects is indispensible in photolithographic processes for advanced technology nodes.Techniques of optical proximity correction (OPC) enable to increase the achievable resolution and the pattern transfer fidelity for advanced lithographic generations. Corrections are made on the mask based on OPC models which connect the image on the resin to the changes made on the mask. The reliability of these OPC models is essential for the improvement of the pattern transfer fidelity.This thesis analyses and evaluates the OPC resist models which simulates the behavior of the resist after the photolithographic process. Data modeling and statistical analysis have been used to study these increasingly empirical resist models. Besides the model calibration data reliability, we worked on the way of using the models calibration platforms generally used in IC manufacturing.This thesis exposed the results of the analysis of OPC resist models and proposes a new methodology for OPC resist models creation, analysis and validation.
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Mame Kouna Top. Analyse des modèles résines pour la correction des effets de proximité en lithographie optique. Autre. Université de Grenoble, 2011. Français. ⟨NNT : 2011GRENT007⟩. ⟨tel-00721951⟩

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