L. Tensioactifs-Étant-choisis, nous souhaitons quantifier le gain en énergie de surface par leur présence dans l'eau. Pour cela, nous avons effectué des mesures d'angles de contact

. Au-chapitre, nous avons tenté de quantifier la valeur de la tension interfaciale solide-liquide des substrats. Il s'est avéré après calculs, que le modèle d'Owens et Wendt a atteint ses limites puisque l'adhésion estimée entre les substrats et l'eau, était une valeur négative (-9 mN.m -1 )

. La-mesure-de-l, angle de contact avec l'eau est aisée, par contre, avec une goutte de surfactant, la goutte s'étale rapidement jusqu

J. M. Cases, Ionic surfactants adsorption on heterogeneous surfaces, 2002.
DOI : 10.1016/s1631-0713(02)01798-4

C. Cho and W. M. Sigmund, Direct Surface Force Measurement in Water Using a Nanosize Colloidal Probe Technique, Journal of Colloid and Interface Science, vol.245, issue.2, pp.405-407, 2002.
DOI : 10.1006/jcis.2001.8075

P. M. Cleassoncooper, A. Gupta, and S. Beaudoin, Experimental evidence for repulsive and attractive forces not accounted by conventional DLVO theory Dooley; IAPWS Release Surface Tension of Ordinary Water Substance Simulation of particle adhesion : implications in chemical mechanical polishing and post CMP cleaning, Progress in Colloid and Polymer Science, pp.48-54, 1987.

A. ]. Cooper, S. Gupta, and . Beaudoin, Simulation of the Adhesion of Particles to Surfaces, Journal of Colloid and Interface Science, vol.234, issue.2, pp.284-292, 2001.
DOI : 10.1006/jcis.2000.7276

C. Cooper, S. Eichenlaub, A. Gupta, and S. Beaudoin, Adhesion of Alumina Particles to Thin Films, Journal of The Electrochemical Society, vol.149, issue.4, pp.239-244, 2002.
DOI : 10.1149/1.1452122

J. ]. Croker, A. D. Matteo, A. G. Dinsmore, and . Yodh, Entropic Attraction and Repulsion in Binary Colloids Probed with a Line Optical Tweezer, Physical Review Letters, vol.82, issue.21, pp.4352-4355, 1999.
DOI : 10.1103/PhysRevLett.82.4352

. Gennes, Quéré; Gouttes, bulles, perles et ondes, Derjaguin, L. Landau; Theory of the stability of strongly charged particles lyophobic sols and the adhesion of strong charged particles in solutions of electrolytes, 1941.

T. Didenko and K. S. Suslick, The energy efficiency of formation of photons, radicals and ions during single-bubble cavitation, Nature, vol.35, issue.6896, pp.25-27, 2002.
DOI : 10.1121/1.421279

W. A. Ducker, T. J. Senden, and R. M. Pashley, Measurement of forces in liquids using a force microscope, Langmuir, vol.8, issue.7, pp.1831-1836, 1992.
DOI : 10.1021/la00043a024

. J. Ghzaoui-]-;-r, El Ghzaoui; Evaluation de la contamination minérale et organique, application au lavage d'une surface polymérique Emerson IV; Microbial adhesion to medical implant materials: an atomic force microscopy study, Thèse, 1997.

G. V. Franks and L. Meagher, Collection Grenoble Science [Franks The isoelectric points of sapphire crystals and alu mina powder, J.P. Franc; La cavitation, vol.214, pp.99-110, 1995.

. ]. Fuchs, The Fundamental Theory and Application of Ultrasonics for Cleaning, Precision cleaning'95 Proceedings, pp.334-346, 1995.
DOI : 10.1201/b10897-15

G. W. Gale and A. Gale, ROLES OF CAVITATION AND ACOUSTIC STREAMING IN MEGASONIC CLEANING, Particulate Science and Technology, vol.1, issue.3, pp.229-238, 1999.
DOI : 10.1021/j100372a048

J. L. Gazapo and J. Gea, Anodisation de l'aluminium, p.5203, 2001.

M. ]. Georges, J. M. Giersbers, G. J. Kleijn, M. A. Fleer, . Cohen et al., Dispersion et forces de surfaces dans les hydrocarbures Forces between polymer-coverded surfaces: a colloidal probe study, Thèse EC Lyon [Giersbers, pp.343-353, 1996.

M. Giersbers, J. M. Giersbers, M. A. Kleijn, . Cohen, and . Stuart, The Electrical Double Layer on Gold Probed by Electrokinetic and Surface Force Measurements, Journal of Colloid and Interface Science, vol.248, issue.1, pp.88-95, 2002.
DOI : 10.1006/jcis.2001.8144

M. Gotzinger and W. Peukert, Particle Adhesion Force Distributions on Rough Surfaces, Langmuir, vol.20, issue.13, pp.5290-5303, 2004.
DOI : 10.1021/la049914f

D. ]. Guitian and . Joseph, Foaminess measurements using a shaker bottle Haussonne; Céramiques pour composants électroniques, J.M, 1996.

S. Henderson, S. Mitchell, and P. Bartlett, Direct measurements of colloidal friction coefficients, Physical Review E, vol.64, issue.6, p.61403, 2001.
DOI : 10.1103/PhysRevE.64.061403

R. G. Horn, B. R. Clarke, and M. T. Clarkson, Direct measurement of surface forces between sapphire crystals and aqueous solutions Hall; Surfaces forces and viscosity of water measured between silica sheets, J. Mater. Res, vol.35, issue.4, pp.413-416, 1988.

Y. S. Horsthorst, J. Chen, U. Kruger, and . Kunz, Design of ultrasound reactors; 1997; Plenary Lecture Application of power in physical and chemical processing, 1997.

D. B. Hough, L. R. White-]-;-r, M. Hunter, F. W. Itano, M. Kern et al., The calculation of Hamaker constants from Lifshitz theory with application to wetting phenomena Zeta potential in colloid science Israelachvili; Intermolecular and interface forces Particle removal from silicon wafer surface in wet cleaning process, Bustamante; A comparaison of the interaction forces between model alumina surfaces and their colloid properties, pp.3-41, 1980.

B. ]. Kelkar, K. Mishra, F. S. Srinivasa-rao, C. Goyal, and . Manohar, Transition from a nonionic to an ionic micelle, Physical Review A, vol.44, issue.12, pp.8421-8424, 1991.
DOI : 10.1103/PhysRevA.44.8421

D. Kern and . Puotinen, Cleaning solutions based on H2O2 for use in silicon semiconductor technology, RCA Review, vol.31, pp.187-206, 1970.

K. ]. Kralchevsky, N. D. Danov, K. K. Denkov, J. M. Lam, and . Newton, Chemical physics of colloid systems ans interfaces; 2002; Handbook of Surface and Colloid Chemistry Effect of temperature on particulate solid adhesion to a substrate, Powder Technology, vol.5, issue.73, pp.267-274, 1992.

. ]. Lamm, Tech Spotlight : An ultrasonic Era; 2001; www.precisioncleaningweb.com [Larpent, 1995]; Larpent; Tensio actifs, 1995.

J. ]. Larson, S. W. Ralston, W. M. Lee, and . Sigmund, Atomic Force Microscopy and colloid interaction forces; 2002; Encyclopedia of surface and Colloid Science, M. Dekker [Lee, 2001.

S. W. Lee, W. M. Lee, and . Sigmund, AFM study of repulsive van der Waals forces between Teflon AF thin film and silica or alumini, pp.43-50, 2002.

. Lees, K. A. Lee, C. Marx, and . Sung, High resolution atomic force microscopic images of nanoscale structures, Microsc. Microanal, vol.10, issue.2, pp.560-561, 2004.

L. ]. Mansard, G. V. Meagher, M. L. Franks, and P. Lee, Mécanismes de retrait des contaminations particulaires et métalliques sur les substrats de la microélectronique, optimisation des procédés de nettoyages après polissage mécano-chimique Scales; Interaction forces between alpha aluminafibres in aqueous electrolyte measured with atomic force microscope, J, vol.146, pp.123-137, 1999.

. Michaut, Michaut; Des ultrasons pour une chimie plus propre Hays; Small particle adhesion: measurement and control, La Recherche, vol.361, issue.165, pp.11-23, 2000.

. Mori, Mori; Effect of surface roughness on adhesive force between solid surfaces in aqueous solutions, Science and Engineering Review of Doshisha University, vol.43, issue.4, pp.36-41, 2002.

. Mouche, Etude de la contamination particulaire et métallique des substrats de silicium en solution Blum; Adsorption of sodium n-decylbenzenesulfonate onto alumina, Thèse Aix Marseille [Nagashima, pp.8-15, 1994.

F. D. Nagashima and . Blum, Adsorption and dynamics of sodium alkylbenzenesulfonates on alumina, Colloids and Surfaces A: Physicochemical and Engineering Aspects, vol.176, issue.1, pp.17-24, 2001.
DOI : 10.1016/S0927-7757(00)00611-7

. Niemczewski, Niemczewski; Influence od surfactant additives on the intensity of acoustic causative agents of ultrasonic cleaning in water, Trans IMF, vol.80, issue.4, pp.137-138, 2002.

E. ]. Noltinck, A. Neppiras; Cavitation produced by ultrasonics, Proc. Phys, 1950.

J. ]. Owen, R. Croker, A. G. Verma, and . Yodh, Measurement of long-range steric repulsions between microspheres due to an adsorbed polymer, Physical Review E, vol.64, issue.1, p.11401, 2001.
DOI : 10.1103/PhysRevE.64.011401

P. ]. Palla and . Shah, Stabilization of High Ionic Strength Slurries Using Surfactant Mixtures: Molecular Factors That Determine Optimal Stability, Journal of Colloid and Interface Science, vol.256, issue.1, pp.143-152, 2002.
DOI : 10.1006/jcis.2002.8648

S. Paria and K. C. Khilar, A review on experimental studies of surfactant adsorption at the hydrophilic solid???water interface, Advances in Colloid and Interface Science, vol.110, issue.3, pp.75-95, 1965.
DOI : 10.1016/j.cis.2004.03.001

W. ]. Partyka, B. Rudzinsky, J. H. Brun, and . Clint, Colorimetric studies of adsorption of anionic surfactants onto alumina, Langmuir, vol.5, pp.2-298, 1989.

R. S. Premachandran and S. G. Malghan, Atlas of electrical equilibria in aqueous solution: aluminium; 1974; National association of corrosion engineers Cebelcor [Prelot, 2001]; B. Prelot; Mesure et modélisation de l'hétérogénéité énergétique à l'interface oxyde/électrolyte/ métaux Electrokinetic behavior and dispersion characteristics of ceramic powders with cationic and anionic polyelectrolytes, Thèse INPL [Premachandran, pp.911-920, 1974.

H. J. Butt, Direct measurement of forces between particules and bubbles, Int. J. Mineral Process, vol.56, pp.99-114, 1999.

Y. Qin and . Li, Mechanisms of particle removal from silicon wafer surface in wet chemical cleaning process, Journal of Colloid and Interface Science, vol.261, issue.2, pp.569-574, 2003.
DOI : 10.1016/S0021-9797(03)00053-5

I. Rabinovich, J. J. Adler, A. Ata, R. K. Singh, and B. M. , Adhesion between Nanoscale Rough Surfaces, Journal of Colloid and Interface Science, vol.232, issue.1, pp.10-16, 2000.
DOI : 10.1006/jcis.2000.7167
URL : http://ufdc.ufl.edu/LS00000181/00006

J. ]. Rabinovich, A. Adler, R. K. Ata, and B. M. Singh, Adhesion between Nanoscale Rough Surfaces, Journal of Colloid and Interface Science, vol.232, issue.1, pp.17-24, 2000.
DOI : 10.1006/jcis.2000.7168

I. Rabinovich, J. J. Adler, M. S. Esayanur, A. Ata, R. K. Singh et al., Moudgil; Capillary forces between surfaces with nanoscale roughness, Colloid and Interface Science, pp.213-230, 2002.
DOI : 10.1016/s0001-8686(01)00082-3
URL : http://ufdc.ufl.edu/LS00000007/00003

D. S. Rimai, D. J. Rimai, J. P. Quesnel, S. Rossel, M. C. Allen et al., Fundamental of particule adhesion Global press [Rossel Williams; Electrostatic interactions observed when imaging proteins with atomic force microscope, Tendler, P.M, 2001.

W. Rudzinski, A. Rudzinski, S. Domino, B. Partyka, and . Brun, A simple adsorption equation for adsorption of non ionic surfactant on hydrophilic surfaces of silica, Adsorption Science and Technology, vol.2, pp.207-218, 1985.

J. L. Salager, H. Sadek, A. K. Helmy, V. M. Sabet, and T. F. Tadros, Surfactifs : types et usages Cahier FIRF n°F300A Adsorption of potential determining ions at the alumina oxide-aqueous interface and the point of zero charge, J. Electoanal. Chem, vol.27, pp.257-266, 1970.