Développement d'un banc ellipsométrique hyperfréquence pour la caractérisation de matériaux non transparents

Abstract : The control of the physical properties of materials used to manufacture a product is essential. Therefore, it is necessary to determine their behavioral properties. Generally, we get them through intermediate physical properties such as electromagnetic properties. We have developed a technique for contactless characterization of non-transparent materials by applying the basic concepts of optical ellipsometry in the microwave domain. The characterization is done by solving an inverse problem through two different numerical methods: a classical optimization method using the iterative algorithm of Levenberg Marquardt and a regression method by using neural networks particularly the multilayer perceptron. With the first method, we can determine two parameters which are the refractive index and the extinction index of the sample under test. With the second method, we can determine the indices and the thickness of the sample. As a validation, we set up a 30 GHz - experimental free space bench configurated for oblique transmission incidence measurement that we have used to carry out measurements on PTFE and epoxy samples having different thicknesses (1 to 30 mm). We obtained a satisfactory characterization of the index and thickness. Then, we have carried out measurements on three types of paper. The index was satisfactorily characterized but they could not be distinguished. These studies have shown that it is possible to characterize thick and non-transparent materials using ellipsometric technics
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Amir Moungache. Développement d'un banc ellipsométrique hyperfréquence pour la caractérisation de matériaux non transparents. Autre. Université Jean Monnet - Saint-Etienne, 2011. Français. ⟨NNT : 2011STET4017⟩. ⟨tel-00700486⟩

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