FIABILITE DE DIODES LASER DE FORTE PUISSANCE 808 nm MICROASSEMBLEES POUR DES APPLICATIONS SPATIALES : Approche expérimentale et modélisations par éléments finis

Abstract : This work thesis describes a new technique for electro-optical characterization of high power laser diode (HPLD) bars at emitter level and establishment of an early degradation indicator to demonstrate their reliability for space applications (>3×109 Shots at 100Hz/200μs). The degradation analysis of aged HPLD bar is related to the evolution of optical power, optical spectrum (λmax) and degree of polarization (DOP) of each emitter in the bar. Experimental studies were reinforced by thermal and mechanical finite element simulations by introducing several technological parameters, and to build a methodology to increase reliable emitters in the plane (DOP, λmax) in order to improve the reliability of HPLDs.
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https://tel.archives-ouvertes.fr/tel-00674044
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Submitted on : Friday, February 24, 2012 - 5:53:36 PM
Last modification on : Thursday, January 11, 2018 - 6:21:08 AM

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  • HAL Id : tel-00674044, version 1

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Othman Rehioui. FIABILITE DE DIODES LASER DE FORTE PUISSANCE 808 nm MICROASSEMBLEES POUR DES APPLICATIONS SPATIALES : Approche expérimentale et modélisations par éléments finis. Electronique. Université Sciences et Technologies - Bordeaux I, 2011. Français. ⟨tel-00674044⟩

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