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Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique

Abstract : In this thesis, noncontact atomic force microscopy (NC-AFM) and Kelvin probe force microscopy (KPFM) under ultrahigh vacuum have been applied to investigate the nanostructure and electronic surface properties of model materials for organic photovoltaics. First, it has been demonstrated that the surface photovoltage of nanoscale phase segregated donor-acceptor photovoltaic blends can be finely resolved at the nanometer scale by using amplitude modulation KPFM (AM-KPFM). Next, model self-assembled π-conjugated oligomers have been investigated, in order to obtain a deeper insight into the nature of the tip-surface forces involved in the KPFM imaging process. A crossover between long-range (LR) and short-range (SR) regimes has been evidenced by combining high resolution imaging with distance-spectroscopy measurements. It has also been shown that the influence of the SR electrostatic forces can be minimized by working at the onset of the damping contrast. Finally, using this procedure, the local work function of flexible transparent electrodes, comprised of functionalized carbon nanotubes by metallic nanoparticles, has been investigated, and compared to the averaged value deduced from ultraviolet photoelectron spectroscopy.
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Submitted on : Thursday, December 1, 2011 - 6:02:39 PM
Last modification on : Monday, June 8, 2020 - 11:03:00 AM
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Evan Spadafora. Etude par microscopie à force atomique en mode non contact et microscopie à sonde de Kelvin, de matériaux modèles pour le photovoltaïque organique. Autre [cond-mat.other]. Université de Grenoble, 2011. Français. ⟨NNT : 2011GRENY050⟩. ⟨tel-00647312⟩

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