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Méthode adaptative de contrôle logique et de test de circuits AMS/FR

Abstract : Analogue-mixed-signal (AMS) and Radio frequency (RF) devices are required in many applications such as communications, multimedia, and signal processing. These applications are often subject to severe area constraints. The complexity of AMS and RF cores, together with shrinking device dimensions limit accessibility to the internal nodes of the circuit. This makes the test and the control of this circuit very difficult. Ensuring high test/control quality at low cost for these AMS and RF designs has become an important challenge for test engineers. RF and AMS cores are generally incorporated in a chip including large digital components as microprocessors and memories. The main idea of this work is to develop for these components simple test and control methods which can be implemented in the embedded resources of the system at low cost. The proposed techniques use autoregressive models for the devices under test/control. These models take into account the specific nonlinearities to such devices. Only the behavioural model parameters of the system are used to predict the system performances which are necessary to develop the test signature and/or control the consumption of the circuit. This method is implemented on a dsPiC30f for testing and controlling two demonstrators: a front-end RF card, designed in RMS group of TIMA laboratory, and a MMA7361L 3 axis accelerometer.
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Submitted on : Thursday, December 1, 2011 - 3:53:13 PM
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  • HAL Id : tel-00647169, version 1

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STAR | CNRS | TIMA | UGA

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Rafik Khereddine. Méthode adaptative de contrôle logique et de test de circuits AMS/FR. Autre. Université de Grenoble, 2011. Français. ⟨NNT : 2011GRENT054⟩. ⟨tel-00647169⟩

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