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Modes de défaillance induits par l'environnement radiatif naturel dans les mémoires DRAMs : étude, méthodologie de test et protection

Abstract : DRAMs are frequently used in space and aeronautic systems. Their sensitivity to cosmic radiations have to be known in order to satisfy reliability requirements for critical applications. These evaluations are traditionally done with particle accelerators. However, devices become more complex with technology integration. Therefore new effects appear, inducing longer and more expensive tests. There is a complementary solution: the pulsed laser, which trigger similar effects as particles. Thanks to these two test tools, main DRAM radiation failure modes were studied: SEUs (Single Event Upset) in memory blocks, and SEFIs (Single Event Functional Interrupt) in peripheral circuits. This work demonstrates the influence of test patterns on SEU and SEFI sensitivities depending on technology used. In addition, this study identifies the origin of the most frequent type of SEFIs. Moreover, laser techniques were developed to quantify sensitive surfaces of the different effects. This work led to a new test methodology for industry, in order to optimize test cost and efficiency using both pulsed laser beams and particle accelerators. Finally, a new fault tolerant technique is proposed: based on DRAM cell radiation immunity when discharged, this technique allows to correct all bits of a logic word.
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Submitted on : Wednesday, November 2, 2011 - 3:19:13 PM
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Antonin Bougerol. Modes de défaillance induits par l'environnement radiatif naturel dans les mémoires DRAMs : étude, méthodologie de test et protection. Autre. Université de Grenoble, 2011. Français. ⟨NNT : 2011GRENT020⟩. ⟨tel-00610137⟩

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