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ETUDE DES MECANISMES MIS EN JEU DANS LA FIABILITE DES MICRO-COMMUTATEURS MEMS-RF

David Mardivirin 1
1 MINACOM
XLIM - XLIM
Abstract : The work presented in this manuscript focus on the characterization and analysis of failure mechanisms that appear in a new family of microwave components and RF MEMS (RadioFrequency Micro-Electro-Mechanical Systems). If these components have quickly attracted a lot of hopes to solve a large number of locks on new communication architectures, it appeared that the reliability of these components has greatly slowed their industrial development. Moreover, these micro-switches result from a multi-physics coupling which added a high complexity and difficulty of understanding how they work and thus their reliability. Currently, numerous and intense efforts are made by the scientific community (university and industry), as this issue was left open many questions and unresolved problems. This thesis aims to contribute on this area, both on experimental, theoretical and technological plans.
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https://tel.archives-ouvertes.fr/tel-00608495
Contributor : David Mardivirin <>
Submitted on : Wednesday, July 13, 2011 - 11:42:56 AM
Last modification on : Thursday, January 11, 2018 - 6:26:12 AM
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David Mardivirin. ETUDE DES MECANISMES MIS EN JEU DANS LA FIABILITE DES MICRO-COMMUTATEURS MEMS-RF. Micro et nanotechnologies/Microélectronique. Université de Limoges, 2010. Français. ⟨tel-00608495⟩

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