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Probabilistic modelling of rock damage : application to geological storage of CO2

Abstract : The storage of CO2 in deep geologieal formations is considered as a possible way to reduce emissions of greenhouse gases in the atmosphere. The condition of the rocks constituting the reservoir is a key parameter on which rely both storage safety and efficiency. The objective of this thesis is to characterize the risks generated by a possible change of mechanical and transfer properties of the material of the basement after an injection of CO2. Large-scale simulations aiming at representing the process of injection of CO2 at the supercritical state into an underground reservoir were perforined. An analysis of the obtained stress fields shows the possibility of generating various forms of material degradation for high injection rates. The work is devoted to the study of the emergence of opened cracks. Following an analytical and simplified study of the initiation and growth of opened cracks based on a probabilistic model, it is shown that the formation of a crack network is possible. The focus is then to develop in the finite element code Code Aster a numerical tool to simulate the formation of crack networks. A nonlocal rnodel based on stress regularization is proposed. A test on the stress intensity factor is used to describe crack propagation. The initiation of new cracks is modeled by a Poisson-Weibull process. The used parameters are identified by an experimental campaign conducted on samples from an actual geological site for CO2 storage. The model developed is then validated on numerical cases, and also against experimental results carried out herein.
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Submitted on : Wednesday, March 2, 2011 - 11:18:01 AM
Last modification on : Thursday, December 10, 2020 - 10:58:03 AM
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  • HAL Id : tel-00572783, version 1

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Nicolas Guy. Probabilistic modelling of rock damage : application to geological storage of CO2. Mechanics [physics.med-ph]. École normale supérieure de Cachan - ENS Cachan, 2010. English. ⟨NNT : 2010DENS0013⟩. ⟨tel-00572783⟩

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