Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits

Abstract : Recent deep-submicron technology-based ICs are significantly more vulnerable to transient faults. The arisen errors are thus also more critical than they have ever been before. This thesis presents a further novel benefit of the Quasi-Delay Insensitive (QDI) asynchronous circuits in terms of reliability: their strong natural ability to mitigate longduration transient faults that are severe in modern synchronous circuits. A methodology to evaluate comparatively the transient-fault effects on synchronous and QDI asynchronous circuits is presented. Furthermore, a method to obtain the transient-fault mitigation ability of the QDI circuits' memory elements (i.e., the C-elements) is also proposed. Finally, mitigation techniques are suggested to increase even more the Celements' transient-fault attenuation, and thus also the QDI asynchronous systems' robustness.
Document type :
Theses
Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2010. English


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Submitted on : Tuesday, November 30, 2010 - 1:46:10 PM
Last modification on : Tuesday, November 30, 2010 - 10:32:53 PM

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R. Possamai Bastos. Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits. Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2010. English. <tel-00541344>

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