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Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits

Abstract : Recent deep-submicron technology-based ICs are significantly more vulnerable to transient faults. The arisen errors are thus also more critical than they have ever been before. This thesis presents a further novel benefit of the Quasi-Delay Insensitive (QDI) asynchronous circuits in terms of reliability: their strong natural ability to mitigate longduration transient faults that are severe in modern synchronous circuits. A methodology to evaluate comparatively the transient-fault effects on synchronous and QDI asynchronous circuits is presented. Furthermore, a method to obtain the transient-fault mitigation ability of the QDI circuits' memory elements (i.e., the C-elements) is also proposed. Finally, mitigation techniques are suggested to increase even more the Celements' transient-fault attenuation, and thus also the QDI asynchronous systems' robustness.
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https://tel.archives-ouvertes.fr/tel-00541344
Contributor : Lucie Torella <>
Submitted on : Tuesday, November 30, 2010 - 1:46:10 PM
Last modification on : Friday, December 11, 2020 - 8:28:04 AM
Long-term archiving on: : Tuesday, March 1, 2011 - 2:51:14 AM

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  • HAL Id : tel-00541344, version 1

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CNRS | TIMA | UGA

Citation

Rodrigo Possamai Bastos. Transient-Fault Robust Systems Exploiting Quasi-Delay Insensitive Asynchronous Circuits. Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2010. English. ⟨tel-00541344⟩

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