Pour une approche complète de l'évaluation de fiabilité dans les microsystèmes

Abstract : The complexity of microsystems, their multidisciplinarity, the heterogeneity of materials and interfaces with the external environment makes difficult the assessment and control of reliability, which is indispensable for the exploitation of the several innovative opportunities that they offer. The approach we proposed, in this work, to predict the reliability of microsystems is based on the intensive use of modelling and simulation, in the use and environmental conditions of micro-system (mission profile), thus by combining the reliability evaluation in the design process: before undertaking any type of functional modelling VHDL-AMS, reliability objectives are expressed explicitly in the specification of the micro-system, as well as the most common performance goals. To support our work, we applied this approach for predicting the reliability for two types of microsystems: - Electro-thermal micro-actuators. - Capacitive RF MEMS switches.
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Micro and nanotechnologies/Microelectronics. INSA de Toulouse, 2010. French


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Submitted on : Tuesday, November 23, 2010 - 11:18:56 AM
Last modification on : Tuesday, March 24, 2015 - 1:04:53 AM

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Mohamed Matmat. Pour une approche complète de l'évaluation de fiabilité dans les microsystèmes. Micro and nanotechnologies/Microelectronics. INSA de Toulouse, 2010. French. <tel-00538717>

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