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Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs

Jinyu Jason Ruan 1
1 LAAS-MINC - Équipe MIcro et Nanosystèmes pour les Communications sans fil
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : Future architectures of communication systems will be more and more complex due to the need for reconfigurability in terms of frequency, emitted and received power, power consumption and reliability. One interesting and very promising technology comes under the name of RF-MEMS. In general MEMS component replaces and outperforms its counterparts. These structures will be yielded to electrostatic and/or electromagnetic strains that it is necessary to investigate and to understand the effects. Besides, power handling of those devices is one of the parameters that qualify its robustness. Since they have shown interesting functionalities for space applications, its sensitivity to radiation needs to be understood. The motivation of the thesis aims at analyzing the impact of those strains in the functional parameters (actuation voltages, switching times, insertion losses, isolation), using an appropriate reliability bench test. Clever analyses of the failure mechanisms that occur after stresses such as DC stress, ESD discharge, RF power qualification and radiation, have been performed. The stresses will be applied on various structures with various architectures and designs, in order to determine the robustness and the reliability of each technology. Finally, the validation and the new findings of these works present one design integrating ESD protection and an accelerated stress test circuit is also proposed. This thesis was being part of the framework of the European Network of Excellence AMICOM on RF Micro-systems where reliability has been defined to be a major challenge to its integration and its commercialization.
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Contributor : Arlette Evrard <>
Submitted on : Monday, August 30, 2010 - 9:17:02 AM
Last modification on : Thursday, June 10, 2021 - 3:01:23 AM
Long-term archiving on: : Friday, December 2, 2016 - 12:09:31 AM


  • HAL Id : tel-00512333, version 1


Jinyu Jason Ruan. Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs. Networking and Internet Architecture [cs.NI]. Université Paul Sabatier - Toulouse III, 2010. English. ⟨tel-00512333⟩



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