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M. Bensetti, Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, Adaptive Mesh Refinement and Probe Signal Calculation in Eddy Current NDT by Complementary Formulations, IEEE Transactions on Magnetics, vol.44, issue.6, pp.1646-1649, 2008.
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S. Paillard, Y. Choua, G. Pichenot, Y. Le-bihan, M. Lambert et al., MODELLING OF FLAWED RIVETED STRUCTURES FOR EC INSPECTION IN AERONAUTICS, AIP Conference Proceedings, pp.217-224, 2008.
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Y. Choua, L. Santandréa, Y. L. Bihan, and C. Marchand, Thin Crack Modeling in ECT With Combined Potential Formulations, IEEE Transactions on Magnetics, vol.43, issue.4, pp.1789-1792, 2007.
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Y. Choua, L. Santandréa, Y. L. Bihan, and C. Marchand, Modelling of thin crack in ECT using a ? ? formulation with Whitney elements Evaluation of finite elements models of cracks for ECT, Septembre 2005. Communications internationales avec actes Y. Choua Conférence Européenne sur les méthodes numériques en Electromagnétisme NUMELEC, 2008.

Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, Study of the DOF management of dual formulations for the modelling of thin cracks in ECT, European Magnetic Sensors & Actuators Conference EMSA, 2008.
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L. Santandréa, Y. Choua, Y. Le-bihan, and C. Marchand, Using mortar element method for eddy current testing finite element computations, Conference on the Computation of Electromagnetic Fields COMPUMAG, pp.579-580, 2007.

M. Bensetti, Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, Adaptive Mesh Refinement and Probe Signal Calculation in Eddy Current NDT by Complementary Formulations, IEEE Transactions on Magnetics, vol.44, issue.6, 2007.
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Y. Le-bihan, J. Pavo, Y. Choua, M. Bensetti, and C. Marchand, Study on the calculation by FEM-BIM combination of the EC signal due to a thin crack in pre, 2009.

. Cardiff, S. Pays-de-galles, Y. Paillard, G. Choua, Y. Pichenot et al., Modelling of flawed riveted structures for EC inspection in aeronautics, 12th International Workshop on Electromagnetic Nondestructive Evaluation ENDE, pp.42-50, 2007.

Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, specific developments on a finite element tool for thin crack modelling in EC testing, 9th European Conference on Non-Destructive Testing ECNDT, 2006.

Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, Thin Crack Modeling in ECT with Combined Potential Formulations, 12th Biennial IEEE Conference on Electromagntic Field Computation CEFC, 2006.

L. Santandréa, Y. Choua, Y. Le-bihan, and C. Marchand, Adaptive mesh refinement for eddy current testing finite element computations, 6th International Conference on Computation in Electromagnetics CEM, 2006.

Y. Choua, L. Santandréa, Y. Le-bihan, and C. Marchand, Modelling of a thin crack in ECT using a ? ? formulation with Whitney elements, International Symposium on Applied Electromagnetics and Mechanics ISEM, 2005.

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