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Etude du couplage fort par spectroscopie optique dans des microcavités GaN élaborées sur silicium

Abstract : This work presents an optical spectroscopy study through reflectivity, photoluminescence and transmission (from 5 K to 300 K) on the light-matter strong coupling regime in bulk and quantum well nitride microcavities grown on silicon substrate. The experiments have been interpreted within the transfer-matrix formalism taking into account both homogeneous and inhomogeneous excitonic broadenings. The influence of the structure (cavity thickness, number of pairs of the Bragg mirror, nature of the mirror, ...) on the strong coupling regime has been studied through experimental results obtained from various cavities. The transfer-matrix model has been compared to the quasiparticle model with experimental results. We show then, this last model works only when the reflectivity is very high, the transfer-matrix model being more accurate because the real structure of the cavity is taken into account. This thesis work ends with the study of double dielectric mirror microcavities. Two different ways to improve the quality factor of the cavity and the excitonic broadening (through the improvement of the active layer quality) are reported. The strong coupling is reported through transmission measurements for the first time.
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Contributor : François Réveret <>
Submitted on : Tuesday, September 1, 2009 - 6:29:26 PM
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  • HAL Id : tel-00412515, version 1


François Réveret. Etude du couplage fort par spectroscopie optique dans des microcavités GaN élaborées sur silicium. Matière Condensée [cond-mat]. Université Blaise Pascal - Clermont-Ferrand II, 2008. Français. ⟨tel-00412515⟩



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