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P. Parmi-eux,-je-ne-mentionnerai-que-le-nom-de and . Mathiez, Les thésards occupent bien entendu une place particulière Ainsi les noms de Frank Palmino, Michel Ramonda et aujourd'hui Philippe Guaino doivent-ils apparaître ici. Beaucoup de stagiaires ont secondé ces thésards. Il n'est pas possible de tous les citer mais lorsque je remonte le temps quelques noms s'imposent

V. La-présence-de and . Derycke, Charles-Antoine Guérin a notamment effectué de très nombreuses simulations numériques qui nous ont aidé à mieux comprendre les mécanismes de croissance. Enfin, Bassam Bouffakhrèdine a joué le role de passerelle dans le cadre de notre collaboration avec le laboratoire d'optique de l'ENSPM. Egalement, des visiteurs et des collaborateurs plus confirmés, ont séjourné à Luminy ou nous ont accueilli dans leur laboratoire. H.Neddermeyer, U.Koelher et Per Martensson nous ont visité à l'époque où nous nous interressions aux premiers stades de la croissance métal/semiconducteurs. La collaboration avec IBM Zurich s'est étendu sur plusieurs années. J'ai plus particuliérement interagit avec J.K.Gimzewski et son groupe notamment dans le cadre de notre programme sur l'émission de lumière en STM. C'est également dans ce cadre que s'est instaurée notre collaboration avec Igor Makarenko (Ioffe, St.Petersbourg, dir.A.Titkov) qui nous a très régulièrement visité et qui a notamment travaillé avec les échantillons reçus de J.Massies (CRHEA, Sophia) ou de R.Houdré (EPFL, Lausanne) Aujourd'hui, cette thématique a trouvé une résonance à l'échelle Européenne, Wilfried Blanc a participé aux premiéres expériences sur les films autoorganisés. La rapidité du démarrage des études sur et Marseille) qui nous permet d'accueillir Andrew Downes pour trois ans. Si ce n'était pas tout à fait le début, la collaboration avec Cl.Amra (LOSCM, Marseille) a marqué un tournant de travailler avec Ph.Allongue ou de collaborer avec

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. Ph, M. Dumas, C. Gu, J. K. Syrykh, I. Gimzewski et al., Direct observation of individual nanometer-sized light-emitting structures on porous silicon surfaces, Europhysics Letters, vol.23, issue.3, pp.197-202, 1993.

M. Gu, C. Syrykh, A. Halimaoui, P. Dumas, and F. Salvan, Low-energy scanning cathodoluminescence spectroscopy and microscopy of porous silicon layers, Journal of Luminescence, vol.57, issue.1-6, pp.315-319, 1993.
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. Ph, M. Dumas, C. Gu, A. Syrykh, F. Halimaoui et al., 21-Nanostucturing of porous silicon using scanning tunneling microscopy, J. Vac. Sci. Technol. B, issue.3, p.12, 1994.

. Photon, . Porous-silicon, . Ph, M. Dumas, C. Gu et al., 23-Silicon roughness induced by plasma etching, Vac. Sci. Technol. B J. Appl. Phys, vol.12, issue.311, p.75, 1994.

F. Thibaudau, T. P. Roge, . Ph, P. Mathiez, F. Dumas et al., Cooperative Segregation of Boron at Si(111), Europhysics Letters (EPL), vol.25, issue.5, pp.353-356, 1994.
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J. R. Roche, M. Ramonda, and F. Thibaudau, Structure of Si(111) surfaces etched in 40% NH4F: Influence of the doping, Microscopy Microanalysis Microstructures, vol.5, issue.4-6, pp.291-299, 1994.
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M. Ramonda, D. Albertini, H. Dallaporta, . Ph, W. Dumas et al., Elaboration of silicon clusters by CVD of silane or laser ablation, Microelectronic Engineering, vol.30, issue.1-4, p.443, 1996.
DOI : 10.1016/0167-9317(95)00283-9

C. Deumiè, R. Richier, P. Dumas, and C. , Multiscale roughness in optical multilayers: atomic force microscopy and light scattering, Applied Optics, vol.35, issue.28, pp.5583-5594, 1996.
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P. Brault, P. Dumas, and F. Salvan, Roughness scaling of plasma-etched silicon surfaces, Journal of Physics: Condensed Matter, vol.10, issue.1, pp.27-32, 1998.
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M. Ramonda, P. Dumas, and &. F. Salvan, On the roughness of ideally planar H???Si(111) surfaces. An atomic force microscopy approach, Surface Science, vol.411, issue.1-2, pp.839-843, 1998.
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P. Microscopies-de, Des spectroscopies aux processus physiques Thèse d'habilitation ? Janvier, 2001.

H. Klein, N. Battaglini, B. Bellini, and . Ph, STM of mixed alkylthiol self-assembled monolayers on Au(111), Materials Science and Engineering: C, vol.19, issue.1-2, pp.279-283, 2002.
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