C. Bloqués, 1 CNTFET passant + 1 CNTFET bloqué. (1) Défauts fonctionnels doubles de type CNTFETs passants. Pour la porte INV, il y a au total 28 cas différents de paires de transistors CNTFETs mais il y a seulement 6 cas de paires de transistors CNTFETs passants entraînant un disfonctionnement de la porte, P1,P2), (P1,P4), (P2,P3), (P3,P4), (N1,N2), (N3,N4)

S. La-probabilité-de-défaut-d, un transistor CNTFET est de Dt et si cette probabilité est distribuée également entre les deux sortes de défauts (bloqué ou passant), nous avons alors une probabilité pour chaque type de défaut égale à Dh=Dt/2. Considérons par exemple la porte NAND2 redondante, se composant de 16 transistors CNTFETs. Cette porte fonctionne correctement quand les 16 transistors sont bons, ce qui survient avec une probabilité, -Dt) 16 ], ou si seulement l'un de ces 16 transistors est défectueux, cas ayant une probabilité

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