Portes logiques à base de CNTFETs – dispersion des caractéristiques et tolérance aux défauts

Abstract : Amongst novel nanodevices, CNTFETs are promising candidates. But circuits based on CNTFETs will have a high probability of manufacturing defects and large characteristic dispersions. In this context, this thesis studies the implementation of CNTFET-based elementary logic gates. A precise comparison of several logic structures shows the advantages of the complementary structure for future applications. The influence of parametric variations on the CNTFET and complementary logic gate characteristics is then analyzed. A synthetic study is presented on the specific defects and transient faults in CNTFET-based circuits. Finally, a redundant logic structure is proposed to reduce the effect of parametric dispersions and to improve the manufacturing yield by tolerating some defects.
Document type :
Theses
Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2008. French


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Contributor : Lucie Torella <>
Submitted on : Thursday, October 2, 2008 - 11:17:15 AM
Last modification on : Thursday, October 2, 2008 - 11:25:40 AM

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T. Dang. Portes logiques à base de CNTFETs – dispersion des caractéristiques et tolérance aux défauts. Micro and nanotechnologies/Microelectronics. Institut National Polytechnique de Grenoble - INPG, 2008. French. <tel-00326225>

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