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Test et autotest de circuits complexes

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https://tel.archives-ouvertes.fr/tel-00297307
Contributor : Thèses Imag <>
Submitted on : Tuesday, July 15, 2008 - 5:34:11 PM
Last modification on : Friday, November 6, 2020 - 3:46:04 AM
Long-term archiving on: : Saturday, May 29, 2010 - 12:41:22 AM

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  • HAL Id : tel-00297307, version 1

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José-Maria Gobbi. Test et autotest de circuits complexes. Modélisation et simulation. Institut National Polytechnique de Grenoble - INPG, 1981. Français. ⟨tel-00297307⟩

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