Skip to Main content Skip to Navigation
Theses

Méthodologie de modélisation et de caractérisation de l'immunité des cartes électroniques vis-à-vis des décharges électrostatiques (ESD)

Nicolas Lacrampe 1
1 LAAS-ISGE - Équipe Intégration de Systèmes de Gestion de l'Énergie
LAAS - Laboratoire d'analyse et d'architecture des systèmes
Abstract : Thanks to the continuous increase of the integrated circuits performance, electronics has greatly expanded in most sectors and particularly in embedded systems. These systems must meet the strong reliability constraints to withstand stresses from transient events as varied as electrostatic discharge (ESD). At present, the impact of these stresses on the return customers rate of integrated circuits is 40 to 50%. To improve the immunity system, and thus reduce production costs and tracking system, it becomes necessary to take into account these disturbances as soon as the conception and to have a comprehensive protection approach. Within these works of thesis, we have developed a simulation methodology, models and characterization techniques associated in order to estimate the impact of an ESD stress at all points of an electronic board depending on the characteristics of each component and placement / routing. The approach of modeling chosen is based on the functional circuit tools design of circuits and boards, and uses VHDL-AMS which the IEEE certification makes it an industry standard. For the characterization, the originality concerns the using of a pulsing test bench like Very Fast-TLP, coupled with various injection methods, which allows both the parameters extraction for the models and to observe the IC stressed response on the board. The major result of this study is the ability to simulate the electronic board response to an ESD stress (eg IEC ESD stress) since its impact to any input / output components pins of the board. The approach is validated through a simple circuit test, but also on a more complex application based on a microcontroller. It enables to ensure that each component is adequate in terms of robustness and to detect unwanted couplings.
Complete list of metadatas

Cited literature [17 references]  Display  Hide  Download

https://tel.archives-ouvertes.fr/tel-00283105
Contributor : Arlette Evrard <>
Submitted on : Thursday, May 29, 2008 - 10:15:57 AM
Last modification on : Monday, October 19, 2020 - 11:00:41 AM
Long-term archiving on: : Friday, September 28, 2012 - 3:00:49 PM

Identifiers

  • HAL Id : tel-00283105, version 1

Citation

Nicolas Lacrampe. Méthodologie de modélisation et de caractérisation de l'immunité des cartes électroniques vis-à-vis des décharges électrostatiques (ESD). Micro et nanotechnologies/Microélectronique. INSA de Toulouse, 2008. Français. ⟨tel-00283105⟩

Share

Metrics

Record views

547

Files downloads

5605