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Modélisation, estimation et contrôle de Microscope á Force Atomique

Abstract : The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy from the control point of view. This analysis allows us to propose improvements for the Atomic Force Microscopes standard functions. Control approach plays an important role in all this development but profound understanding of the instruments physics has to be reached as well.
The second chapter briefly but completely overviews the most important techniques to operate the Scanning Probe Microscope and more precisely the AFM. This chapter should unveil advantages and difficulties of the existing techniques. The most basic function parts of AFM are presented. Followed by a summary of Contact (static) operation mode and Non-contact (dynamic) operation mode.
The third chapter concentrates on the modeling of surface interactions and the dynamic of the cantilever with the tip. A simplified model of the surface interaction forces is presented and used as a base to performed simulations later on. Followed by a simplified cantilever model and a more complex multi-mode model based on the beam theory with implemented model for the thermal excitation.
The fourth chapter presents an application of observer techniques to Atomic Force Microscopy. A short introduction to all present measurements and detection disturbances is given at the beginning. Theoretical introduction of the observer and its application in control follows. Then two observer applications to Atomic Force Microscope in Amplitude Modulation technique and a new static force measurement are presented.
The fifth chapter presents a new operation mode of Atomic Force Microscope based on static measurement of the interaction force. A cold damping technique is used to be able to operate the cantilever in completely static regime and its description is given at the beginning of the chapter. Followed, by theoretical definition and description of a new operation mode called “Cooling mode". The main advantages and disadvantages compared to the standard AFM operation modes are listed to see the functionality improvements and limitations. Experimental setup used to prove this concept is designed and identified in the following text. This information allows us to design a stabilizing controller using pole placement techniques. The realtime measurement results are presented at the end of this chapter.
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Contributor : Michal Hrouzek Connect in order to contact the contributor
Submitted on : Saturday, March 29, 2008 - 12:55:36 AM
Last modification on : Friday, March 25, 2022 - 11:09:53 AM
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  • HAL Id : tel-00267958, version 1



Michal Hrouzek. Modélisation, estimation et contrôle de Microscope á Force Atomique. Automatique / Robotique. Université Joseph-Fourier - Grenoble I, 2007. Français. ⟨tel-00267958⟩



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